Datasheet

R01DS0052EJ0140 Rev.1.40 Page 135 of 150
2014.07.16
RX62N Group, RX621 Group 5. Electrical Characteristics
5.5 A/D Conversion Characteristics
Note 1. The conversion time includes the sampling time and the comparison time. As the test conditions, the number of sampling states
is indicated.
Note 2. The scanning is not supported.
Note 3. The value in parentheses indicates the sampling time.
Note 1. The time conversion takes is the sum of the sampling interval and the time comparison takes (permissible signal-source
impedance is up to 1.0 kΩ)
Table 5.20
10-Bit A/D Conversion Characteristics
Conditions: VCC = PLLVCC = AVCC = VCC_USB = 2.7 to 3.6 V, VREFH = 2.7 V to AVCC
VSS = PLLVSS = AVSS = VREFL = VSS_USB = 0 V
PCLK = 8 to 50 MHz
T
a
= -40 to +85C
Item Min. Typ. Max. Unit Test Conditions
Resolution 10 10 10 bits
Conversion
time
*1
(PCLK = 50-MHz
operation)
With
0.1-µF
external
capacitor
When the capacitor is charged
enough
*2
0.8 (0.3)
*3
——µsSampling
15 states
Without
external
capacitor
Permissible signal source
impedance (max.) = 1.0 kΩ
1.0 (0.5)
*3
—— Sampling
25 states
Permissible signal source
impedance (max.) = 5.0 kΩ
2.6 (2.1)
*3
—— Sampling
105 states
Analog input capacitance — — 6.0 pF
INL integral nonlinearity error — ±1.5 ±3.0 LSB
Offset error — ±1.5 ±3.0 LSB
Full-scale error — ±1.5 ±3.0 LSB
Quantization error — ±0.5 — LSB
Absolute accuracy — ±1.5 ±3.0 LSB
DNL differential nonlinearity error — ±0.5 ±1.0 LSB
Table 5.21
12-Bit A/D Conversion Characteristics
Conditions: VCC = PLLVCC = AVCC = VCC_USB = 2.7 to 3.6 V, VREFH = 2.7 V to AVCC
VSS = PLLVSS = AVSS = VREFL = VSS_USB = 0 V
PCLK = 8 to 50 MHz
T
a
= -40 to +85C
Item Min. Typ. Max. Unit Test Conditions
Resolution 12 12 12 bits
Conversion time
*1
1.0 — — µs AVCC ≥ 3.0
2.0 — — µs AVCC ≥ 2.7
Analog input capacitance — — 30 pF
Offset error — ±2.0 ±7.5 LSB
Full-scale error — ±2.0 ±7.5 LSB
Quantization error — ±0.5 — LSB
Absolute accuracy — ±2.5 ±8.0 LSB
Nonlinearity error — ±2.0 ±4.0 LSB