Datasheet
Section 25 Electrical Characteristics 
Page 1246 of 1384    R01UH0310EJ0500 Rev. 5.00 
 Sep 25, 2012 
H8S/2426, H8S/2426R, H8S/2424 Group
25.2.6  Flash Memory Characteristics 
Table 25.25  Flash Memory Characteristics 
Conditions: V
CC
 = 3.0 V to 3.6 V, AV
CC
 = 3.0 V to 3.6 V, V
ref
 = 3.0 V to AV
CC
, V
SS
 = AV
SS
 = 0 V, 
φ = 8 MHz to 33 MHz 
Standard value  Unit 
Item Applicable area Min. Typ. Max.  
User ROM  1000*
2
  ⎯  ⎯ Programming and erase count*
1
Data flash area  10000*
2
  ⎯  ⎯ 
Times 
User ROM  ⎯ 150 4000 Programming time 
(per 4 bytes) 
Data flash area  ⎯ 300 4000 
μs 
User ROM  ⎯ 300 3000 Erase time (per 1 block) 
Data flash area  ⎯ 300 3000 
ms 
User ROM  3.0 Programming and erase voltage 
Data flash area   
⎯ 3.6 V 
User ROM Read voltage 
Data flash area 
3.0  ⎯ 3.6 V 
User ROM  1  ⎯  ⎯ Access state 
Data flash area  2  ⎯  ⎯ 
State 
Notes:  1.  In the system where multiple programming are executed, erase once so as to effectively diminish 
the programming times after having written with leaving the blank area as least as possible by 
shifting writing address one by one. 
    For example, if 16 bytes per 1 set is being programmed, erase once after maximum 256 sets of 
programming has been done, which diminish the effective programming times. 
    Keep the information of the times of erasure and set up the limitation times is recommended. 
  2.  If an erase error is occurred, execute the clear status command -> erase command for at least 3 
times until no erase error is occurred. 
  *1.  Determination of the number of times the programming/erase operation. 
    Number of times the programming/erase performed in each block. 
When the number of times the programming/erase is n times (n = 100), data can be erased n times 
in each block. 
For example, if 4 bytes programming is done 1024 times, each at a different address in a 4-kbyte 
per block, and then the block is erased, number of times the programming/erase can be one time. 
However, programming cannot be done multiple times in the block (overwriting is prohibited). 
  *2.  Number of times that ensures all the electrical characteristics. 










