User`s manual

213
13) Testing Emulation RAM Trace :
A) Free Trace ..........................OK
B) Range Trace .........................OK
C) Point to Point Trace ................OK
D) Start and Stop Event Trace ..........OK
E) Trace memory overflow ...............OK
F) Time STAMP Trace (24 MHz) ...........OK
G) Time STAMP Trace (10 MHz) ...........OK
Shows the check results
for the trace controlling
circuits in the E6000
(normal completion).
14) Testing Runtime counter :
A) Runtime Counter (24 MHz) ............OK
B) Runtime Counter (20 MHz) ............OK
C) Runtime Counter (10 MHz) ............OK
Shows the check results
for the run-time counter
in the E6000 (normal
completion).
15) Testing Emulation Monitor :
A) EMA23-EMA0 ..........................OK
B) ACST2-ACST0 .........................OK
C) ASEST3-ASEST0 .......................OK
D) ASEBRKACK (MONIT0E) .................OK
E) CNN .................................OK
F) NOCLK ...............................OK
Shows the check results
for the emulation monitor
controlling circuits in
the E6000 (normal
completion).
16) Testing PERFM G/A :
A) Time Measurement (Unit 20ns) ........OK
B) Time Measurement (Unit Target) ......OK
C) Subroutine Count Measurement ........OK
D) Timeout Function (TIMOT Bit) ........OK
E) Timeout Function (TIMOP Bit) ........OK
Shows the check results
for analysis controlling
circuits in the E6000
(normal completion).
17) Testing Bus Monitor :
A) Register ................................OK
B) Parallel RAM ............................OK
C) SPRSEL2 .................................OK
D) RAM monitor .............................OK
Shows the check results
for the bus monitor
controlling circuits in
the E6000 (normal
completion).
18) Testing Parallel Access :
A) Internal ROM Parallel Read Access(WORD) ...........OK
B) Internal ROM Parallel Write Access(WORD) ..........OK
C) Internal ROM Parallel Write Access(High Byte) .....OK
D) Internal ROM Parallel Write Access(Low Byte) ......OK
E) Internal RAM Parallel Read Access(WORD) ...........OK
F) Internal RAM Parallel Write Access(WORD) ..........OK
G) Internal RAM Parallel Write Access(High Byte) .....OK
H) Internal RAM Parallel Write Access(Low Byte) ......OK
I) Option RAM Parallel Read Access (WORD) ............Skip
J) Option RAM Parallel Write Access(WORD) ............Skip
K) Option RAM Parallel Write Access(High Byte) .......Skip
L) Option RAM Parallel Write Access(Low Byte) ........Skip
Shows the check results
for the parallel access
controlling circuits in
the E6000 (normal
completion).
0 total errors Total number of errors.
Tests passed, emulator functioning correctly Shows that the E6000 is
correctly operating.