Product data
100
Item Symbol Min Typ Max Unit Test Conditions
Input RES I
in
— — 10.0 µA V
in
= 0.5 to
leakage
current
STBY, NMI, MD1,
MD0
— — 1.0 µA
V
CC
– 0.5 V
Port 7 — — 1.0 µA V
in
= 0.5 to
AV
CC
– 0.5 V
Three-state
leakage
current
(off state)
Ports 1 to 6 I
TSI
— — 1.0 µA V
in
= 0.5 to
V
CC
– 0.5 V
Input
pull-up
MOS
Ports 1 to 3 –I
P
30 — 300 µA V
in
= 0 V,
V
CC
= 4.5 V to
5.5 V
current
20 — 200 µA V
in
= 0 V,
V
CC
< 4.5 V
Input
capacitance
RES (4) C
in
— — 80 pF V
in
= 0 V,
f = 1 MHz,
NMI — — 50 pF
T
a
= 25°C
P52, P47,
P24, P23
— — 20 pF
Input pins
except (4) above
— — 15 pF
Current Normal operation I
CC
— 35 44 mA f = 16 MHz
dissipation
*
6
Sleep mode — 25 34 mA f = 16 MHz
Standby mode
*
7
— 1.0 5.0 µA T
a
≤ 50°C
— — 20.0 µA 50°C < T
a
Analog
power
During A/D
conversion
Al
CC
— 1.5 3.0 mA
supply
current
Idle — 0.01 5.0 µA AV
CC
=
2.0 V to 5.5 V
Analog power supply voltage
*
1
AV
CC
4.0 — 5.5 V Operating
2.0 — 5.5 V Idle/not used
RAM standby voltage V
RAM
2.0 — — V
Notes: *1 Do not leave the AV
CC
, and AV
SS
pins open even if the A/D converter is not used.
Even if the A/D converter is not used, apply a value in the range 2.0 V to 5.5 V to AV
CC
by connection to the power supply (V
CC
), or some other method.
*2 P67 to P60 include supporting module inputs multiplexed on those pins.
*3 IRQ2 includes the ADTRG signal multiplexed on that pin.
*4 In the H8S/2128S Series, P52/SCK0/SCL0 and P47/SDA0 are NMOS push-pull
outputs.