User`s manual
Table Of Contents
- Cover
- Keep safety first in your circuit designs!
- Notes regarding these materials
- IMPORTANT INFORMATION
- SAFETY PAGE
- Introduction
- About This Manual
- Contents
- Emulator Debugger Part
- Section 1 Overview
- Section 2 Preparation before Use
- Section 3 E6000 Emulator Functions
- Section 4 Preparation before Use
- Section 5 Debugging
- 5.1 Setting the Environment for Emulation
- 5.2 Downloading a Program
- 5.3 Viewing the Current Status
- 5.4 Reading and Displaying the Emulator Information Regularly
- 5.5 Displaying Memory Contents in Realtime
- 5.6 Viewing the Variables
- 5.7 Using the Event Points
- 5.7.1 Software Breakpoints
- 5.7.2 Event Points
- 5.7.3 Event Detection System
- 5.7.4 Signals to Indicate Bus States and Areas
- 5.7.5 Opening the [Event] Window
- 5.7.6 Setting Software Breakpoints
- 5.7.7 Setting Event Points
- 5.7.8 Setting Trigger Points
- 5.7.9 Editing Event Points
- 5.7.10 Modifying Event Points
- 5.7.11 Enabling an Event Point
- 5.7.12 Disabling an Event Point
- 5.7.13 Deleting an Event Point
- 5.7.14 Deleting All Event Points
- 5.7.15 Viewing the Source Line for an Event Point
- 5.8 Viewing the Trace Information
- 5.8.1 Opening the [Trace] Window
- 5.8.2 Acquiring Trace Information
- 5.8.3 Specifying Trace Acquisition Conditions
- 5.8.4 Searching for a Trace Record
- 5.8.5 Clearing the Trace Information
- 5.8.6 Saving the Trace Information in a File
- 5.8.7 Viewing the [Editor] Window
- 5.8.8 Trimming the Source
- 5.8.9 Acquiring a Snapshot of the Trace Information
- 5.8.10 Temporarily Stopping Trace Acquisition
- 5.8.11 Restarting Trace Acquisition
- 5.8.12 Extracting Records from the Acquired Information
- 5.8.13 Calculating the Difference in Time Stamping
- 5.8.14 Analyzing Statistical Information
- 5.8.15 Extracting Function Calls from the Acquired Trace Information
- 5.9 Analyzing Performance
- Section 6 Tutorial
- 6.1 Introduction
- 6.2 Running the High-performance Embedded Workshop
- 6.3 Downloading the Tutorial Program
- 6.4 Setting a Software Breakpoint
- 6.5 Setting Registers
- 6.6 Executing the Program
- 6.7 Reviewing Breakpoints
- 6.8 Referring to Symbols
- 6.9 Viewing Memory
- 6.10 Watching Variables
- 6.11 Displaying Local Variables
- 6.12 Stepping Through a Program
- 6.13 Forced Breaking of Program Executions
- 6.14 Resetting the MCU
- 6.15 Break Function
- 6.16 Trace Functions
- 6.17 Stack Trace Function
- 6.18 Performance Measurement Function
- 6.19 Monitor Function
- 6.20 What Next?
- Section 7 Hardware Specifications Specific to This Product
- 7.1 H8/3800 E6000 Emulator Specifications
- 7.2 User System Interface of H8/3800 E6000 Emulator
- 7.3 Differences between MCU and H8/3800 E6000 Emulator
- 7.4 Handling Evaluation Chip Board (HS3800EBK61H)
- 7.5 Host PC Interface (only for HS38000EPI61H + HS3800EBK61H)
- 7.6 H8/388R E6000 Emulator Specifications
- 7.7 User System Interface of H8/388R E6000 Emulator
- 7.8 Differences between MCU and H8/388R E6000 Emulator
- 7.9 Handling Evaluation Chip Board (HS388REBK61H)
- 7.10 Host PC Interface (only for HS38000EPI61H + HS388REBK61H)
- Section 8 Software Specifications Specific to This Product
- 8.1 Software Specifications of the H8/3800 E6000 Emulator
- 8.1.1 Target Hardware
- 8.1.2 Selectable Platform
- 8.1.3 [Configuration Properties] Dialog Box ([General] Page)
- 8.1.4 Memory Mapping Function
- 8.1.5 [Status] Window
- 8.1.6 Extended Monitor Function
- 8.1.7 Signals to Indicate Bus States and Areas
- 8.1.8 Monitoring Function
- 8.1.9 Trigger Points
- 8.1.10 Trace Information
- 8.1.11 Searching for a Trace Record
- 8.1.12 Trace Filtering Function
- 8.2 Note on Usage of the H8/3800 E6000 Emulator
- 8.3 Software Specifications of the H8/388R E6000 Emulator
- 8.3.1 Target Hardware
- 8.3.2 Selectable Platforms
- 8.3.3 [Configuration Properties] Dialog Box ([General] Page)
- 8.3.4 Memory Mapping Function
- 8.3.5 [Status] Window
- 8.3.6 Extended Monitor Function
- 8.3.7 Signals to Indicate Bus States and Areas
- 8.3.8 Monitoring Function
- 8.3.9 Trigger Points
- 8.3.10 Trace Information
- 8.3.11 Searching for a Trace Record
- 8.3.12 Trace Filtering Function
- 8.4 Note on Usage of the H8/388R E6000 Emulator
- 8.5 Performance Analysis Function
- 8.1 Software Specifications of the H8/3800 E6000 Emulator
- Appendix A I/O File Format
- Appendix B Menus
- Appendix C Command Lines
- Appendix D Diagnostic Test Procedure
- Colophon
229
03) Test Firmware RAM :
A) Decode Test page[H'700 - H'71f] ....................OK
Shows the results of
decoding test for the
firmware RAM in the
E6000 (normal
completion).
B) Marching test page[H'700 - H'71f] ....................OK Shows the results of
marching test for the
firmware RAM in the
E6000 (normal
completion).
04) Test Trace memory :
A) Decode Test page[H'000 - H'04f](Lower 32K) .........OK
Shows the results of
decoding test for the
trace RAM (first half)
in the E6000 (normal
completion).
B) Marching test page[H'000 - H'04f](Lower 32K) .........OK Shows the results of
marching test for the
trace RAM (first half)
in the E6000 (normal
completion).
C) Decode Test page[H'000 - H'04f](Upper 32K) .........OK Shows the results of
decoding test for the
trace RAM (last half) in
the E6000 (normal
completion).
D) Marching test page[H'000 - H'04f](Upper 32K) .........OK Shows the results of
marching test for the
trace RAM (last half) in
the E6000 (normal
completion).
05) Test Map control memory :
A) Decode Test page[H'200 - H'27f] ....................OK
Shows the results of
decoding test for the
mapping RAM in the E6000
(normal completion).
B) Marching test page[H'200 – H'27f] ....................OK Shows the results of
marching test for the
mapping RAM in the E6000
(normal completion).
06) Test Internal ROM and RAM :
A) Decode Test (Internal ROM) ..........................OK
B) Marching test (Internal ROM) ..........................OK
C) Decode Test (Internal RAM) ..........................OK
D) Marching Test (Internal RAM) ..........................OK
E) Decode Test (LCD RAM) ...............................OK
F) Decode Test (STM) ...................................OK
G) Marching Test (STM) ...................................OK
Shows the results of
decoding test and
marching test for
internal ROM and RAM in
the E6000 (normal
completion).
07) RESERVED