Datasheet

Section 14 Boundary Scan Function
REJ09B0140-0900 Rev. 9.00 Page 473 of 846
Sep 16, 2010
H8S/2215 Group
14.2 Pin Configuration
Table 14.1 shows the I/O pins used in the boundary scan function.
Table 14.1 Pin Configuration
Pin Name I/O Function
TMS Input Test Mode Select
Controls the TAP controller which is a 16-state Finite State
Machine.
The TMS input value at the rising edge of TCK determines
the status transition direction on the TAP controller.
The TMS is fixed high when the boundary scan function is not
used.
The protocol is based on JTAG standard (IEEE Std.1149.1).
This pin has a pull-up resistor.
TCK Input Test Clock
A clock signal for the boundary scan function.
When the boundary scan function is used, input a clock of
50% duty to this pin.
This pin has a pull-up resistor.
TDI Input Test Data Input
A data input signal for the boundary scan function.
Data input from the TDI is latched at the rising edge of TCK.
TDI is fixed high when the boundary scan function is not
used.
This pin has a pull-up resistor.
TDO Output Test Data Output
A data output signal for the boundary scan function. Data
output from the TDO changes at the falling edge of TCK. The
output driver of the TDO is driven only when it is necessary
only in Shift-IR or Shift-DR states, and is brought to the high-
impedance state when not necessary.
TRST Input Test Reset
Asynchronously resets the TAP controller when TRST is
brought low.
The user must apply power-on reset signal specific to the
boundary scan function when the power is supplied (For
details on signal design, see section 14.5, Usage Notes).
This pin has a pull-up resistor.