Datasheet

Table Of Contents
Section 14 Boundary Scan Function
REJ09B0140-0900 Rev. 9.00 Page 471 of 846
Sep 16, 2010
H8S/2215 Group
Section 14 Boundary Scan Function
This LSI incorporates a boundary scan function, which is a serial I/O interface based on the JTAG
(Joint Test Action Group, IEEEStd.1149.1 and IEEE Standard Test Access Port and Boundary
Scan Architecture). Figure 14.1 shows the block diagram of the boundary scan function.
14.1 Features
Five test signals
TCK, TDI, TDO, TMS, TRST
Six test modes supported
BYAPASS, SAMPLE/PRELOAD, EXTEST, CLAMP, HIGHZ, IDCODE
Boundary scan function cannot be performed on the following pins.
Power supply pins: VCC, VSS, Vref, AVCC, AVSS, PLLVCC, PLLVSS, PLLCAP,
DrVCC, DrVSS
Clock signals: EXTAL, XTAL, EXTAL48, XTAL48
Analog signals: P40 to P43, P96, P97, USD+, USD-
Boundary scan signals: TCK, TDI, TDO, TMS, TRST
E10A signal (EMLE)
IFJTAG0A_000020020100