Datasheet

Section 13 Boundary Scan Function
Rev.7.00 Dec. 24, 2008 Page 449 of 698
REJ09B0074-0700
Section 13 Boundary Scan Function
The HD64F2218, HD64F2218U, HD64F2218CU and HD64F2217CU incorporate a boundary
scan function, which is a serial I/O interface based on the JTAG (Joint Test Action Group,
IEEEStd.1149.1 and IEEE Standard Test Access Port and Boundary Scan Architecture). Figure
13.1 shows the block diagram of the boundary scan function.
13.1 Features
• Five test signals
⎯ TCK, TDI, TDO, TMS, TRST
• Six test modes supported
⎯ BYAPASS, SAMPLE/PRELOAD, EXTEST, CLAMP, HIGHZ, IDCODE
• Boundary scan function cannot be performed on the following pins.
⎯ Power supply pins: VCC, VSS, Vref, PLLVCC, PLLVSS, DrVCC, DrVSS
⎯ Clock signals: EXTAL, XTAL, OSC2, OSC1
⎯ Analog signals: P40 to P43, P96, P97, USD+, USD-
⎯ Boundary scan signals: TCK, TDI, TDO, TMS, TRST
⎯ H-UDI control signal: EMLE