Datasheet

Rev. 4.00 Sep 27, 2006 page xx of xliv
Item Page Revision (See Manual for Details)
26.6.6 Flash Memory
Characteristics
Table 26.67 Flash
Memory Characteristics
(Programming/erasing
operating range)
908 Table 26.67 amended
Symbol of wait time after SWE-bit clear (Before)
Θ → (After) θ
Item Symbol Min Typ Max Unit
Test
Condition
Reprogramming count N
WEC
100
*
8
10000
*
9
— Times
Data retention time
*
10
t
DRP
10 — — Years
Programming Wait time after SWE-bit setting
*
1
x1——µs
909 Notes 8 to 10 added
Notes:
8. Minimum number of times for which all
characteristics are guaranteed after rewriting (Guarantee range
is 1 to minimum value).
9. Reference value for 25°C (as a guideline, rewriting should
normally function up to this value).
10. Data retention characteristic when rewriting is performed
within the specification range, including the minimum value.
26.7.2 Clock Timing
Figure 26.6 Oscillation
Settling Timing
912 Figure 26.6 amended
t
OSC1
t
OSC1
EXTAL
V
CC
STBY
RES
φ
t
DEXT
t
DEXT
26.7.5 Timing of On-
Chip Supporting Modules
Figure 26.28 I
2
C Bus
Interface Input/Output
Timing (Option)
924 Figure 26.28 amended
SDA0,
SDA1
V
IL
V
IH
t
BUF
P
*
S
*
t
STAH
t
SCLH
t
Sr
t
SCLL
t
SCL
t
Sf
t
of
t
SDAH
SCL0,
SCL1