Users Manual
Table Of Contents
- 37. Serial Sound Interface (SSI)
- 38. Serial Peripheral Interface (RSPIa)
- 38.1 Overview
- 38.2 Register Descriptions
- 38.2.1 RSPI Control Register (SPCR)
- 38.2.2 RSPI Slave Select Polarity Register (SSLP)
- 38.2.3 RSPI Pin Control Register (SPPCR)
- 38.2.4 RSPI Status Register (SPSR)
- 38.2.5 RSPI Data Register (SPDR)
- 38.2.6 RSPI Sequence Control Register (SPSCR)
- 38.2.7 RSPI Sequence Status Register (SPSSR)
- 38.2.8 RSPI Bit Rate Register (SPBR)
- 38.2.9 RSPI Data Control Register (SPDCR)
- 38.2.10 RSPI Clock Delay Register (SPCKD)
- 38.2.11 RSPI Slave Select Negation Delay Register (SSLND)
- 38.2.12 RSPI Next-Access Delay Register (SPND)
- 38.2.13 RSPI Control Register 2 (SPCR2)
- 38.2.14 RSPI Command Register m (SPCMDm) (m = 0 to 7)
- 38.3 Operation
- 38.3.1 Overview of RSPI Operations
- 38.3.2 Controlling RSPI Pins
- 38.3.3 RSPI System Configuration Examples
- 38.3.3.1 Single Master/Single Slave (with This MCU Acting as Master)
- 38.3.3.2 Single Master/Single Slave (with This MCU Acting as Slave)
- 38.3.3.3 Single Master/Multi-Slave (with This MCU Acting as Master)
- 38.3.3.4 Single Master/Multi-Slave (with This MCU Acting as Slave)
- 38.3.3.5 Multi-Master/Multi-Slave (with This MCU Acting as Master)
- 38.3.3.6 Master (Clock Synchronous Operation)/Slave (Clock Synchronous Operation) (with This MCU Acting as Master)
- 38.3.3.7 Master (Clock Synchronous Operation)/Slave (Clock Synchronous Operation) (with This MCU Acting as Slave)
- 38.3.4 Data Format
- 38.3.5 Transfer Format
- 38.3.6 Communications Operating Mode
- 38.3.7 Transmit Buffer Empty/Receive Buffer Full Interrupts
- 38.3.8 Error Detection
- 38.3.9 Initializing RSPI
- 38.3.10 SPI Operation
- 38.3.11 Clock Synchronous Operation
- 38.3.12 Loopback Mode
- 38.3.13 Self-Diagnosis of Parity Bit Function
- 38.3.14 Interrupt Sources
- 38.4 Link Operation by Event Linking
- 38.5 Usage Notes
- 39. CRC Calculator (CRC)
- 40. SD Host Interface (SDHIa)
- 40.1 Overview
- 40.2 Register Details
- 40.2.1 Command Register (SDCMD)
- 40.2.2 Argument Register (SDARG)
- 40.2.3 Data Stop Register (SDSTOP)
- 40.2.4 Block Count Register (SDBLKCNT)
- 40.2.5 Response Register 10 (SDRSP10), Response Register 32 (SDRSP32), Response Register 54 (SDRSP54), Response Register 76 (SDRSP76)
- 40.2.6 SD Status Register 1 (SDSTS1)
- 40.2.7 SD Status Register 2 (SDSTS2)
- 40.2.8 SD Interrupt Mask Register 1 (SDIMSK1)
- 40.2.9 SD Interrupt Mask Register 2 (SDIMSK2)
- 40.2.10 SDHI Clock Control Register (SDCLKCR)
- 40.2.11 Transfer Data Size Register (SDSIZE)
- 40.2.12 Card Access Option Register (SDOPT)
- 40.2.13 SD Error Status Register 1 (SDERSTS1)
- 40.2.14 SD Error Status Register 2 (SDERSTS2)
- 40.2.15 SD Buffer Register (SDBUFR)
- 40.2.16 SDIO Mode Control Register (SDIOMD)
- 40.2.17 SDIO Status Register (SDIOSTS)
- 40.2.18 SDIO Interrupt Mask Register (SDIOIMSK)
- 40.2.19 DMA Transfer Enable Register (SDDMAEN)
- 40.2.20 SDHI Software Reset Register (SDRST)
- 40.2.21 Swap Control Register (SDSWAP)
- 40.3 SDHI Operation
- 40.3.1 Data Block Format of the SD Card
- 40.3.2 SD Buffer and the SDBUFR Register
- 40.3.3 SD Card Detection
- 40.3.4 SD Card Write Protection
- 40.3.5 Communication Errors and Timeouts
- 40.3.6 Examples of Issuing a Command
- 40.3.6.1 Command Absent of Response Reception and Data Transfer
- 40.3.6.2 Command Absent of Data Transfer
- 40.3.6.3 Single Block Read Command (CMD17)
- 40.3.6.4 Single Block Write Command (CMD24)
- 40.3.6.5 Multi-Block Read Command (CMD18)
- 40.3.6.6 Multi-Block Write Command (CMD25)
- 40.3.6.7 IO_RW_DIRECT Command (CMD52)
- 40.3.6.8 IO_RW_EXTENDED Command (CMD53 (Multi-Block Read))
- 40.3.6.9 IO_RW_EXTENDED (CMD53 Multi-Block Write)
- 40.3.6.10 DMA Transfer
- 40.4 Interrupts
- 40.5 Notes on Using the SDHI
- 40.5.1 Illegal Read Access During a Multi-Block Read and How To Avoid It
- 40.5.2 SDBUFR Register Illegal Write Error
- 40.5.3 Automatic Control of the SDHI Clock Output
- 40.5.4 Restrictions on Setting the C52PUB Bit During a Multi-Block Write Sequence
- 40.5.5 Note on Setting the SDCLKCR Register
- 40.5.6 Writing to the SDSTOP Register During a Multi-Block Read Sequence
- 40.5.7 Controlling Module Operation
- 41. Bluetooth Low Energy (BLE)
- 42. Trusted Secure IP (TSIP-Lite)
- 43. Capacitive Touch Sensing Unit (CTSU)
- 43.1 Overview
- 43.2 Register Descriptions
- 43.2.1 CTSU Control Register 0 (CTSUCR0)
- 43.2.2 CTSU Control Register 1 (CTSUCR1)
- 43.2.3 CTSU Synchronous Noise Reduction Setting Register (CTSUSDPRS)
- 43.2.4 CTSU Sensor Stabilization Wait Control Register (CTSUSST)
- 43.2.5 CTSU Measurement Channel Register 0 (CTSUMCH0)
- 43.2.6 CTSU Measurement Channel Register 1 (CTSUMCH1)
- 43.2.7 CTSU Channel Enable Control Register 0 (CTSUCHAC0)
- 43.2.8 CTSU Channel Enable Control Register 1 (CTSUCHAC1)
- 43.2.9 CTSU Channel Enable Control Register 2 (CTSUCHAC2)
- 43.2.10 CTSU Channel Enable Control Register 3 (CTSUCHAC3)
- 43.2.11 CTSU Channel Enable Control Register 4 (CTSUCHAC4)
- 43.2.12 CTSU Channel Transmit/Receive Control Register 0 (CTSUCHTRC0)
- 43.2.13 CTSU Channel Transmit/Receive Control Register 1 (CTSUCHTRC1)
- 43.2.14 CTSU Channel Transmit/Receive Control Register 2 (CTSUCHTRC2)
- 43.2.15 CTSU Channel Transmit/Receive Control Register 3 (CTSUCHTRC3)
- 43.2.16 CTSU Channel Transmit/Receive Control Register 4 (CTSUCHTRC4)
- 43.2.17 CTSU High-Pass Noise Reduction Control Register (CTSUDCLKC)
- 43.2.18 CTSU Status Register (CTSUST)
- 43.2.19 CTSU High-Pass Noise Reduction Spectrum Diffusion Control Register (CTSUSSC)
- 43.2.20 CTSU Sensor Offset Register 0 (CTSUSO0)
- 43.2.21 CTSU Sensor Offset Register 1 (CTSUSO1)
- 43.2.22 CTSU Sensor Counter (CTSUSC)
- 43.2.23 CTSU Reference Counter (CTSURC)
- 43.2.24 CTSU Error Status Register (CTSUERRS)
- 43.3 Operation
- 43.4 Usage Notes
- 44. 12-Bit A/D Converter (S12ADE)
- 44.1 Overview
- 44.2 Register Descriptions
- 44.2.1 A/D Data Registers y (ADDRy) (y = 0 to 7, 16 to 20, 27), A/D Data Duplication Register (ADDBLDR), A/D Temperature Sensor Data Register (ADTSDR), A/D Internal Reference Voltage Data Register (ADOCDR)
- 44.2.2 A/D Self-Diagnosis Data Register (ADRD)
- 44.2.3 A/D Control Register (ADCSR)
- 44.2.4 A/D Channel Select Register A0 (ADANSA0)
- 44.2.5 A/D Channel Select Register A1 (ADANSA1)
- 44.2.6 A/D Channel Select Register B0 (ADANSB0)
- 44.2.7 A/D Channel Select Register B1 (ADANSB1)
- 44.2.8 A/D-Converted Value Addition/Average Function Select Register 0 (ADADS0)
- 44.2.9 A/D-Converted Value Addition/Average Function Select Register 1 (ADADS1)
- 44.2.10 A/D-Converted Value Addition/Average Count Select Register (ADADC)
- 44.2.11 A/D Control Extended Register (ADCER)
- 44.2.12 A/D Conversion Start Trigger Select Register (ADSTRGR)
- 44.2.13 A/D Conversion Extended Input Control Register (ADEXICR)
- 44.2.14 A/D Sampling State Register n (ADSSTRn) (n = 0 to 7, L, T, O)
- 44.2.15 A/D Disconnection Detection Control Register (ADDISCR)
- 44.2.16 A/D Event Link Control Register (ADELCCR)
- 44.2.17 A/D Group Scan Priority Control Register (ADGSPCR)
- 44.2.18 A/D Compare Function Control Register (ADCMPCR)
- 44.2.19 A/D Compare Function Window A Channel Select Register 0 (ADCMPANSR0)
- 44.2.20 A/D Compare Function Window A Channel Select Register 1 (ADCMPANSR1)
- 44.2.21 A/D Compare Function Window A Extended Input Select Register (ADCMPANSER)
- 44.2.22 A/D Compare Function Window A Comparison Condition Setting Register 0 (ADCMPLR0)
- 44.2.23 A/D Compare Function Window A Comparison Condition Setting Register 1 (ADCMPLR1)
- 44.2.24 A/D Compare Function Window A Extended Input Comparison Condition Setting Register (ADCMPLER)
- 44.2.25 A/D Compare Function Window A Lower-Side Level Setting Register (ADCMPDR0)
- 44.2.26 A/D Compare Function Window A Upper-Side Level Setting Register (ADCMPDR1)
- 44.2.27 A/D Compare Function Window A Channel Status Register 0 (ADCMPSR0)
- 44.2.28 A/D Compare Function Window A Channel Status Register 1 (ADCMPSR1)
- 44.2.29 A/D Compare Function Window A Extended Input Channel Status Register (ADCMPSER)
- 44.2.30 A/D High-Potential/Low-Potential Reference Voltage Control Register (ADHVREFCNT)
- 44.2.31 A/D Compare Function Window A/B Status Monitor Register (ADWINMON)
- 44.2.32 A/D Compare Function Window B Channel Select Register (ADCMPBNSR)
- 44.2.33 A/D Compare Function Window B Lower-Side Level Setting Register (ADWINLLB)
- 44.2.34 A/D Compare Function Window B Upper-Side Level Setting Register (ADWINULB)
- 44.2.35 A/D Compare Function Window B Channel Status Register (ADCMPBSR)
- 44.2.36 A/D Data Storage Buffer Register n (ADBUFn) (n = 0 to 15)
R01UH0823EJ0110 Rev.1.10 Page 1268 of 1852
Nov 30, 2020
RX23W Group 36. CAN Module (RSCAN)
36.2.79 Global Test Configuration Register (GTSTCFG)
Modify the GTSTCFG register only in global test mode.
RTMPS[2:0] Bits (RAM Test Page Configuration)
These bits are used to set the RAM test target page number for RAM test. Set a value from 00h to 02h.
36.2.80 Global Test Control Register (GTSTCTRL)
RTME Bit (RAM Test Enable)
Setting this bit to 1 enables RAM test. Modify this bit only in global test mode.
(1) Set the GCTRL.GMDC[1:0] bits to 10b (global test mode).
(2) Unlock protection by successively writing 7575h and 8A8Ah to the GLOCKK register
(3) Set the RTME bit to 1.
(4) Check that the RTME bit is set to 1.
Address(es): RSCAN.GTSTCFG 000A 838Ch
b15b14b13b12b11b10b9b8b7b6b5b4b3b2b1b0
————— RTMPS[2:0] ————————
Value after reset:
0000000000000000
Bit Symbol Bit Name Description R/W
b7 to b0 — Reserved These bits are read as 0. The write value should be 0. R/W
b10 to b8 RTMPS[2:0] RAM Test Page Configuration Set a value within a range of page 0 (00h) to page 2 (02h). R/W
b15 to b11 — Reserved These bits are read as 0. The write value should be 0. R/W
Address(es): RSCAN.GTSTCTRL 000A 838Eh
b7 b6 b5 b4 b3 b2 b1 b0
—————RTME——
Value after reset:
00000000
Bit Symbol Bit Name Description R/W
b1, b0 — Reserved These bits are read as 0. The write value should be 0. R/W
b2 RTME RAM Test Enable 0: RAM test is disabled.
1: RAM test is enabled.
R/W
b7 to b3 — Reserved These bits are read as 0. The write value should be 0. R/W