Users Manual
Table Of Contents
- 37. Serial Sound Interface (SSI)
- 38. Serial Peripheral Interface (RSPIa)
- 38.1 Overview
- 38.2 Register Descriptions
- 38.2.1 RSPI Control Register (SPCR)
- 38.2.2 RSPI Slave Select Polarity Register (SSLP)
- 38.2.3 RSPI Pin Control Register (SPPCR)
- 38.2.4 RSPI Status Register (SPSR)
- 38.2.5 RSPI Data Register (SPDR)
- 38.2.6 RSPI Sequence Control Register (SPSCR)
- 38.2.7 RSPI Sequence Status Register (SPSSR)
- 38.2.8 RSPI Bit Rate Register (SPBR)
- 38.2.9 RSPI Data Control Register (SPDCR)
- 38.2.10 RSPI Clock Delay Register (SPCKD)
- 38.2.11 RSPI Slave Select Negation Delay Register (SSLND)
- 38.2.12 RSPI Next-Access Delay Register (SPND)
- 38.2.13 RSPI Control Register 2 (SPCR2)
- 38.2.14 RSPI Command Register m (SPCMDm) (m = 0 to 7)
- 38.3 Operation
- 38.3.1 Overview of RSPI Operations
- 38.3.2 Controlling RSPI Pins
- 38.3.3 RSPI System Configuration Examples
- 38.3.3.1 Single Master/Single Slave (with This MCU Acting as Master)
- 38.3.3.2 Single Master/Single Slave (with This MCU Acting as Slave)
- 38.3.3.3 Single Master/Multi-Slave (with This MCU Acting as Master)
- 38.3.3.4 Single Master/Multi-Slave (with This MCU Acting as Slave)
- 38.3.3.5 Multi-Master/Multi-Slave (with This MCU Acting as Master)
- 38.3.3.6 Master (Clock Synchronous Operation)/Slave (Clock Synchronous Operation) (with This MCU Acting as Master)
- 38.3.3.7 Master (Clock Synchronous Operation)/Slave (Clock Synchronous Operation) (with This MCU Acting as Slave)
- 38.3.4 Data Format
- 38.3.5 Transfer Format
- 38.3.6 Communications Operating Mode
- 38.3.7 Transmit Buffer Empty/Receive Buffer Full Interrupts
- 38.3.8 Error Detection
- 38.3.9 Initializing RSPI
- 38.3.10 SPI Operation
- 38.3.11 Clock Synchronous Operation
- 38.3.12 Loopback Mode
- 38.3.13 Self-Diagnosis of Parity Bit Function
- 38.3.14 Interrupt Sources
- 38.4 Link Operation by Event Linking
- 38.5 Usage Notes
- 39. CRC Calculator (CRC)
- 40. SD Host Interface (SDHIa)
- 40.1 Overview
- 40.2 Register Details
- 40.2.1 Command Register (SDCMD)
- 40.2.2 Argument Register (SDARG)
- 40.2.3 Data Stop Register (SDSTOP)
- 40.2.4 Block Count Register (SDBLKCNT)
- 40.2.5 Response Register 10 (SDRSP10), Response Register 32 (SDRSP32), Response Register 54 (SDRSP54), Response Register 76 (SDRSP76)
- 40.2.6 SD Status Register 1 (SDSTS1)
- 40.2.7 SD Status Register 2 (SDSTS2)
- 40.2.8 SD Interrupt Mask Register 1 (SDIMSK1)
- 40.2.9 SD Interrupt Mask Register 2 (SDIMSK2)
- 40.2.10 SDHI Clock Control Register (SDCLKCR)
- 40.2.11 Transfer Data Size Register (SDSIZE)
- 40.2.12 Card Access Option Register (SDOPT)
- 40.2.13 SD Error Status Register 1 (SDERSTS1)
- 40.2.14 SD Error Status Register 2 (SDERSTS2)
- 40.2.15 SD Buffer Register (SDBUFR)
- 40.2.16 SDIO Mode Control Register (SDIOMD)
- 40.2.17 SDIO Status Register (SDIOSTS)
- 40.2.18 SDIO Interrupt Mask Register (SDIOIMSK)
- 40.2.19 DMA Transfer Enable Register (SDDMAEN)
- 40.2.20 SDHI Software Reset Register (SDRST)
- 40.2.21 Swap Control Register (SDSWAP)
- 40.3 SDHI Operation
- 40.3.1 Data Block Format of the SD Card
- 40.3.2 SD Buffer and the SDBUFR Register
- 40.3.3 SD Card Detection
- 40.3.4 SD Card Write Protection
- 40.3.5 Communication Errors and Timeouts
- 40.3.6 Examples of Issuing a Command
- 40.3.6.1 Command Absent of Response Reception and Data Transfer
- 40.3.6.2 Command Absent of Data Transfer
- 40.3.6.3 Single Block Read Command (CMD17)
- 40.3.6.4 Single Block Write Command (CMD24)
- 40.3.6.5 Multi-Block Read Command (CMD18)
- 40.3.6.6 Multi-Block Write Command (CMD25)
- 40.3.6.7 IO_RW_DIRECT Command (CMD52)
- 40.3.6.8 IO_RW_EXTENDED Command (CMD53 (Multi-Block Read))
- 40.3.6.9 IO_RW_EXTENDED (CMD53 Multi-Block Write)
- 40.3.6.10 DMA Transfer
- 40.4 Interrupts
- 40.5 Notes on Using the SDHI
- 40.5.1 Illegal Read Access During a Multi-Block Read and How To Avoid It
- 40.5.2 SDBUFR Register Illegal Write Error
- 40.5.3 Automatic Control of the SDHI Clock Output
- 40.5.4 Restrictions on Setting the C52PUB Bit During a Multi-Block Write Sequence
- 40.5.5 Note on Setting the SDCLKCR Register
- 40.5.6 Writing to the SDSTOP Register During a Multi-Block Read Sequence
- 40.5.7 Controlling Module Operation
- 41. Bluetooth Low Energy (BLE)
- 42. Trusted Secure IP (TSIP-Lite)
- 43. Capacitive Touch Sensing Unit (CTSU)
- 43.1 Overview
- 43.2 Register Descriptions
- 43.2.1 CTSU Control Register 0 (CTSUCR0)
- 43.2.2 CTSU Control Register 1 (CTSUCR1)
- 43.2.3 CTSU Synchronous Noise Reduction Setting Register (CTSUSDPRS)
- 43.2.4 CTSU Sensor Stabilization Wait Control Register (CTSUSST)
- 43.2.5 CTSU Measurement Channel Register 0 (CTSUMCH0)
- 43.2.6 CTSU Measurement Channel Register 1 (CTSUMCH1)
- 43.2.7 CTSU Channel Enable Control Register 0 (CTSUCHAC0)
- 43.2.8 CTSU Channel Enable Control Register 1 (CTSUCHAC1)
- 43.2.9 CTSU Channel Enable Control Register 2 (CTSUCHAC2)
- 43.2.10 CTSU Channel Enable Control Register 3 (CTSUCHAC3)
- 43.2.11 CTSU Channel Enable Control Register 4 (CTSUCHAC4)
- 43.2.12 CTSU Channel Transmit/Receive Control Register 0 (CTSUCHTRC0)
- 43.2.13 CTSU Channel Transmit/Receive Control Register 1 (CTSUCHTRC1)
- 43.2.14 CTSU Channel Transmit/Receive Control Register 2 (CTSUCHTRC2)
- 43.2.15 CTSU Channel Transmit/Receive Control Register 3 (CTSUCHTRC3)
- 43.2.16 CTSU Channel Transmit/Receive Control Register 4 (CTSUCHTRC4)
- 43.2.17 CTSU High-Pass Noise Reduction Control Register (CTSUDCLKC)
- 43.2.18 CTSU Status Register (CTSUST)
- 43.2.19 CTSU High-Pass Noise Reduction Spectrum Diffusion Control Register (CTSUSSC)
- 43.2.20 CTSU Sensor Offset Register 0 (CTSUSO0)
- 43.2.21 CTSU Sensor Offset Register 1 (CTSUSO1)
- 43.2.22 CTSU Sensor Counter (CTSUSC)
- 43.2.23 CTSU Reference Counter (CTSURC)
- 43.2.24 CTSU Error Status Register (CTSUERRS)
- 43.3 Operation
- 43.4 Usage Notes
- 44. 12-Bit A/D Converter (S12ADE)
- 44.1 Overview
- 44.2 Register Descriptions
- 44.2.1 A/D Data Registers y (ADDRy) (y = 0 to 7, 16 to 20, 27), A/D Data Duplication Register (ADDBLDR), A/D Temperature Sensor Data Register (ADTSDR), A/D Internal Reference Voltage Data Register (ADOCDR)
- 44.2.2 A/D Self-Diagnosis Data Register (ADRD)
- 44.2.3 A/D Control Register (ADCSR)
- 44.2.4 A/D Channel Select Register A0 (ADANSA0)
- 44.2.5 A/D Channel Select Register A1 (ADANSA1)
- 44.2.6 A/D Channel Select Register B0 (ADANSB0)
- 44.2.7 A/D Channel Select Register B1 (ADANSB1)
- 44.2.8 A/D-Converted Value Addition/Average Function Select Register 0 (ADADS0)
- 44.2.9 A/D-Converted Value Addition/Average Function Select Register 1 (ADADS1)
- 44.2.10 A/D-Converted Value Addition/Average Count Select Register (ADADC)
- 44.2.11 A/D Control Extended Register (ADCER)
- 44.2.12 A/D Conversion Start Trigger Select Register (ADSTRGR)
- 44.2.13 A/D Conversion Extended Input Control Register (ADEXICR)
- 44.2.14 A/D Sampling State Register n (ADSSTRn) (n = 0 to 7, L, T, O)
- 44.2.15 A/D Disconnection Detection Control Register (ADDISCR)
- 44.2.16 A/D Event Link Control Register (ADELCCR)
- 44.2.17 A/D Group Scan Priority Control Register (ADGSPCR)
- 44.2.18 A/D Compare Function Control Register (ADCMPCR)
- 44.2.19 A/D Compare Function Window A Channel Select Register 0 (ADCMPANSR0)
- 44.2.20 A/D Compare Function Window A Channel Select Register 1 (ADCMPANSR1)
- 44.2.21 A/D Compare Function Window A Extended Input Select Register (ADCMPANSER)
- 44.2.22 A/D Compare Function Window A Comparison Condition Setting Register 0 (ADCMPLR0)
- 44.2.23 A/D Compare Function Window A Comparison Condition Setting Register 1 (ADCMPLR1)
- 44.2.24 A/D Compare Function Window A Extended Input Comparison Condition Setting Register (ADCMPLER)
- 44.2.25 A/D Compare Function Window A Lower-Side Level Setting Register (ADCMPDR0)
- 44.2.26 A/D Compare Function Window A Upper-Side Level Setting Register (ADCMPDR1)
- 44.2.27 A/D Compare Function Window A Channel Status Register 0 (ADCMPSR0)
- 44.2.28 A/D Compare Function Window A Channel Status Register 1 (ADCMPSR1)
- 44.2.29 A/D Compare Function Window A Extended Input Channel Status Register (ADCMPSER)
- 44.2.30 A/D High-Potential/Low-Potential Reference Voltage Control Register (ADHVREFCNT)
- 44.2.31 A/D Compare Function Window A/B Status Monitor Register (ADWINMON)
- 44.2.32 A/D Compare Function Window B Channel Select Register (ADCMPBNSR)
- 44.2.33 A/D Compare Function Window B Lower-Side Level Setting Register (ADWINLLB)
- 44.2.34 A/D Compare Function Window B Upper-Side Level Setting Register (ADWINULB)
- 44.2.35 A/D Compare Function Window B Channel Status Register (ADCMPBSR)
- 44.2.36 A/D Data Storage Buffer Register n (ADBUFn) (n = 0 to 15)
R01UH0823EJ0110 Rev.1.10 Page 1548 of 1852
Nov 30, 2020
RX23W Group 44. 12-Bit A/D Converter (S12ADE)
44. 12-Bit A/D Converter (S12ADE)
In this section, “PCLK” is used to refer to PCLKB.
44.1 Overview
This MCU incorporates one unit of a 12-bit successive approximation A/D converter. Up to 14 channel analog inputs,
temperature sensor output, and internal reference voltage are selectable for conversion.
The 12-bit A/D converter converts a maximum of 14 selected channels of analog inputs, temperature sensor output, and
internal reference voltage, which have been selected, into a 12-bit digital value through successive approximation.
The A/D converter has three operating modes: single scan mode in which the analog inputs of up to 14 arbitrarily
selected channels are converted only once in ascending channel order; and continuous scan mode in which the analog
inputs of up to 14 arbitrarily selected channels are continuously converted in ascending channel order; and group scan
mode in which up to 14 channels of the analog inputs are arbitrarily divided into two groups (group A and group B) and
converted in ascending channel order in each group.
In group scan mode, the conditions for scanning start of group A and group B (synchronous trigger) can be
independently selected, thus allowing A/D conversion of group A and group B to be started independently. When group-
A priority control is selected along with operation as described above, if a request to start scanning for group A is
received during A/D conversion for group B, the conversion operation for group B is discontinued and the conversion for
group A starts, which is given priority.
In double trigger mode, one analog input channel arbitrarily selected is converted in single scan mode or group scan
mode (group A), and the resulting data of A/D conversion started by the first and second synchronous triggers are stored
into different registers (duplication of A/D conversion data).
Self-diagnosis is executed once at the beginning of each scan, and one of the three voltages internally generated in the
12-bit A/D converter is converted.
It is prohibited to simultaneously select both temperature sensor output and internal reference voltage. Perform A/D
conversion independently for the temperature sensor output or the internal reference voltage.
The external pin input (VREFH0) or the analog reference voltage (AVCC0) is selectable as the reference voltage on the
high-potential side. The external pin input (VREFL0) or the analog reference voltage (AVSS0) is selectable as the
reference voltage on the low-potential side.
This IP has a compare function (window A and window B). This function is used to specify the high-side reference value
and low-side reference value for window A and window B, respectively. When the A/D-converted value of the selected
channel meets the comparison conditions, the ELC event (S12ADWMELC/S12ADWUMELC) is output according to
the event conditions (A or B, A and B, A exor B). Furthermore, the comparator operation to compare the A/D-converted
value with the low-side reference value is also enabled.
The A/D data storage buffer is a ring buffer consisting of 16 buffers to sequentially store A/D converted data.
Table 44.1 lists the specifications of the 12-bit A/D converter and Table 44.2 lists the functions of the 12-bit A/D
converter.
Figure 44.1 shows a block diagram of the 12-bit A/D converter.