Datasheet

PN512 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 5.2 — 16 June 2016
111352 108 of 137
NXP Semiconductors
PN512
Full NFC Forum-compliant frontend
19.3 Testsignals at pin AUX
Table 161. Testsignal routing (TestSel2Reg = 0Dh)
Pins D6 D5 D4 D3 D2 D1 D0
Testsignal clkstable clk27/8 clk27rf/8 clkrf13rf/4 clk27 clk27rf clk13rf
Table 162. Description of Testsignals
Pins Testsignal Description
D6 clkstable shows if the oscillator delivers a stable signal.
D5 clk27/8 shows the output signal of the oscillator divided by 8
D4 clk27rf/8 shows the clk27rf signal divided by 8
D3 clkrf13/4 shows the clk13rf divided by 4.
D2 clk27 shows the output signal of the oscillator
D1 clk27rf shows the RF clock multiplied by 2.
D0 clk13rf shows the RF clock of 13.56 MHz
Table 163. Testsignal routing (TestSel2Reg = 19h)
Pins D6 D5 D4 D3 D2 D1 D0
Testsignal - TRunning - - - - -
Table 164. Description of Testsignals
Pins Testsignal Description
D6 - -
D5 TRunning TRunning stops 1 clockcycle after TimerIRQ is raised
D4 - -
D3 - -
D2 - -
D1 - -
D0 - -
Table 165. Testsignals description
SelAux Description for Aux1 / Aux2
0000 Tristate
0001 DAC: register TestDAC 1/2
0010 DAC: testsignal corr1
0011 DAC: testsignal corr2
0100 DAC: testsignal MinLevel
0101 DAC: ADC_I
0110 DAC: ADC_Q
0111 DAC: testsignal ADC_I combined with ADC_Q
1000 Testsignal for production test
1001 SAM clock
1010 High
1011 low
1100 TxActive