User guide

Preliminary W24100
Publication Release Date: October 1999
- 7 - Revision A1
DATA RETENTION CHARACTERISTICS
(TA = 0
°
C to 70
°
C)
PARAMETER SYM. TEST CONDITIONS MIN. TYP. MAX. UNIT
V
DD
for Data Retention V
DR
CS
≥
V
DD
-0.2V
2.0 - - V
Data Retention Current I
DDDR
CS
≥
V
DD
-0.2V, V
DD
= 3V
- - 50
µ
A
Chip Deselect to Data
Retention Time
T
CDR
See data retention waveform 0 - - nS
Operation Recovery Time T
R
T
RC
* - - nS
*
Read Cycle Time
DATA RETENTION WAVEFORM
T
CDR
-0.2V
DD
V
VDD
CS
T
R
CS1
V
DR
2V
=
>
=
>
0.9 DD
V
0.9 DD
V
CS2