User manual

Table Of Contents
Publication No. 980935 Rev. M 3152B User Manual
Astronics Test Systems 3152A/3152B Specification Compatibility
C-3
Swept Waveforms
Specification
3152A
3152B
Types
SEQ: Sequencer sweep; requires
calculation
DDS: Native DDS provides fast,
continuous sweep
Parameters
Waveforms
Sine, square or triangle (SEQ)
Sine (DDS or SEQ), square (SEQ),
or triangle (SEQ)
Sweep Spacing
Linear or log
Linear or log
Sweep Direction
Up or down
Up or down
Sweep Duration
.01 to 1000 s
1.4 µs to 40 s
Sweep Frequency Range
1 mHz to 10 MHz
10 Hz to 100 MHz
Sampling Clock
Specification
3152A
3152B
Parameters
Range
100 mHz to 100 MHz
100 mHz to 250 MHz
Resolution
7 digits
11 digits
Reference
Internal ref (optional), CLK10
Internal ref, external ref, CLK10
Source
Internal, external
Internal, external
Phase Locked Loop
Specification
3152A
3152B
Standard Waveforms
Frequency Range (lock)
500 Hz to 10 MHz
500 Hz to 10 MHz
Arbitrary Waveforms
Frequency Range (lock)
500 Hz to 100 M/(points per cycle)
500 Hz to 100 M/(points per cycle)
External Lock Threshold
±10 V with 10 mV resolution,
programmable
±10 V with 10 mV resolution,
programmable
External Lock (max)
30 Vrms
Phase Control
Coarse
± 180º (0.72º resolution or higher)
±180º
Fine
± 36º with 0.01º resolution
±36º with 0.01º resolution
Accuracy
Coarse: 5.4 x frequency (MHz) + res /
2 ± 5º
±2% ±1 sample clock period
Fine: 10%, typical