User manual

Table Of Contents
Publication No. 980935 Rev. M 3152B User Manual
Astronics Test Systems Introduction 1-15
determine the necessary delay time.
Nine standard waveform shapes are available:
Sine
Triangle
Square
Pulse/Ramp
Sine(x)/x
Pulse
Gaussian Pulse
Rising/decaying Exponential Pulse
Noise
DC
Each waveform has parameters for modifying it to suit your
requirements.
Arbitrary (User)
Waveforms
The waveform memory can store one or more arbitrary, or user-
defined, waveforms. The regular 3152B configuration is suppl
ied
with 1 mega-sample (M-sample). A 4 M-
sample waveform memory
option is available on the 3100M/R-3152B models.
You may allocate the entire memory for a single waveform or you
may divide the memory into smaller segments and load each
segment with a differ
ent waveform. By dividing the memory into
multiple segments, you may program the instrument to output the
waveform one segment at a time, using a simple command each
time you want to select a different memory segment. There are no
limitations on the shape
of the arbitrary waveform as long as it
meets certain criteria such as minimum and maximum l
engths and
does not exceed the dynamic range of the DAC (65,535 counts).
Sequenced
Waveforms
The sequence generator lets you link and loop segments in any
order. For
a simple example of a sequenced waveform, see
Figures 1-7 through 1-10. The waveforms in figures 1-7 through 1-
9
are placed in memory segments 1, 2, and 3, respectively. The
sequence generator links and loops these waveforms in a
predefined order to generate the waveform shown in Figure 1-10.
The sequence circuit is useful for generating long waveforms with
repeated sections. Although the waveform only needs to be
programmed once, the sequencer loops
on this segment as many
times as selected. When in sequenced mode, there is no time
delay between linked or looped segments.