User manual

Table Of Contents
3152B User Manual Publication No. 980935 Rev. M
A-8
3152B Specifications Astronics Test Systems
Resolution 11 digits
Hop Table Size 2 to 1000
Dwell Time Mode Fixed or Programmable for each step
Dwell Time 100 ns to 20 s
Dwell Time Resolution 20 ns
Amplitude Hopping
Hopped Waveform Sine wave
Frequency Range 10 Hz to 100 MHz
Resolution 11 digits
Hop Amplitude Range 0 to 16 Vp-p
Resolution Maximum amplitude/4096
Hop Table Size 2 to 5000
Dwell Time Mode Fixed or Programmable for each step
Dwell Time 100 ns to 20 s
Dwell Time Resolution 20 ns
FSK
Shifted Waveform Sine wave
Carrier/Shifted Frequency Range 10 Hz to 100 MHz
Baud Range 1 bit/sec to 10 Mbits/sec
FSK Data Bits Length 2 to 4000
PSK
Shifted Waveform Sine wave
Carrier Frequency Range 10 Hz to 100 MHz
Phase Shift Range 0° to 360°
Baud Range 1 bits/sec to 10 Mbits/sec
PSK Data Bits Length 2 to 4000
ASK
Shifted Waveform Sine wave
Carrier Frequency Range 10 Hz to 100 MHz
Amplitude Shift Range 0 V to 16 Vp-p
Resolution Maximum amplitude/4096
Baud Range 1bits/sec to 2.5 Mbits/sec
ASK Data Bits Length 2 to 4000
3D
Operation Operated from an external utility only such as
ArbConnection, the carrier waveform can be
programmed to freely sweep in three dimensions:
amplitude, frequency and phase.
Modulated Waveform Sine
Carrier Frequency Range 10 Hz to 100 MHz
Modulating Sampling Clock 1 S/s to 2.5 MS/s
Number of profile indexes 2 to 30000