User manual

Table Of Contents
3152B User Manual Publication No. 980935 Rev. M
6-28
Performance Checks Astronics Test Systems
and verify that it is within the low and high limits given in
Table 6-34.
Table 6-34, PLL Tests PM Phase Offset
Function Generator
Frequency Setting
DC Source
Amplitude
Low
Limit
Counter
Phase
Reading
High
Limit
Pass
Fail
10 kHz
2 V
305 °
335°
10 kHz
4.5 V
255°
285°
10 kHz
-2 V
25°
55°
10 kHz
-4.5 V
75°
105°
Arbitrary Waveform
Memory Operation
This tests the integrity of the waveform memory. The waveform
memory stores the waveforms that are being generated at the output
connector and, therefore, flaws in the memory can cause distortions
and impurities in the output waveform.
Waveform
Memory
Equipment: Distortion Analyzer, ArbConnection
Preparation:
1. Connect 3152B output to the distortion analyzer input. Do not
use a 50 Ω load.
2. Configure the 3152B as follows:
SCLK: As required by the test
Waveform: Arbitrary
Amplitude: 5 V
Output: On
3. Using ArbConnection prepare and download the following
waveform:
Wavelength: 500 k points
Waveform: Sine wave
SCLK 100 MS/s
Test Procedure
1. Perform Sine wave distortion. It should be less than 0.1 %.
Test Results Pass Fail
Modulated
Waveform
Operation
This tests the operation of the modulation circuits. It includes tests for
the various modulation functions: FM, AM, FSK, PSK, Frequency
Hopping, Amplitude Hopping, and Sweep. Since the modulation run
modes are common to all modulation functions, they are being tested