Specifications

Processor Presence and Population Check QSSC-S4R Technical Product Specification
264
Table 178. NMI Signal Generation and Event Logging
Causal Event NMI (IA IA-32 Only)
Signal Generation
Front Panel Diag Interrupt
Sensor Event Logging Support
Chassis Control command (pulse diagnostic
interrupt)
X –
Front panel diagnostic interrupt button pressed X X
Watchdog Timer pre-timeout expiration with NMI
/ diagnostic interrupt action
X –
24.10 Sensor Rearm Behavior
24.10.1 Manual vs. Rearm Sensors
Sensors can be either manual or automatic re-arm. An automatic re-arm sensor will “re-arm” (clear) the assertion event
state for a threshold or offset if that threshold or offset is deasserted after having been asserted. This allows a
subsequent assertion of the threshold or offset to generate a new event and associated side-effect. An example side-
effect would be boosting fans due to an upper critical threshold crossing of a temperature sensor. The event state and
the input state (value) of the sensor track each other. Most sensors are auto-rearm.
A manual re-arm sensor does not clear the assertion state even when the threshold or offset becomes deasserted. In
this case, the event state and the input state (value) of the sensor do not track each other. The event assertion state is
“sticky”.
The following methods can be used to re-arm a sensor:
x Automatic re-arm – Only applies to sensors that are designated as “auto-rearm”.
x IPMI command
Re-arm Sensor Event.
x BMC internal method – The BMC may re-arm certain sensors due to a trigger condition. For example, some
sensors may be re-armed due to a system reset.
24.10.2 Rearm and Event Generation
All BMC-owned sensors that show an asserted event status generate a deassertion SEL event when the sensor is
rearmed, provided that the associated SDR is configured to enable a deassertion event for that condition. This applies
regardless of whether the sensor is a threshold/analog sensor or a discrete sensor.
To manually re-arm the sensors, the sequence is outlined below:
1. A failure condition occurs and the BMC logs an assertion event.
2. The sensor is rearmed by one of the methods described in the previous section.
3. The BMC clears the sensor status and, if so configured, generates a deassertion event.
4. The sensor is put into “reading-state-unavailable” state until it is polled again or otherwise updated.
5. The sensor is updated and the “reading-state-unavailable” state is cleared.
A new assertion event will be logged if the fault state is once again detected. There are some special cases,
specifically for sensor offsets representing presence condition, where regeneration of events due to a manual rearm
may be suppressed. This is noted in the sections describing the specific sensors.
All auto-rearm sensors that show an asserted event status generate a deassertion SEL event at the time the BMC
detects that the condition causing the original assertion is no longer present and the associated SDR is configured to
enable a deassertion event for that condition.
24.11 Processor Sensors
The BMC provides IPMI sensors for processors and associated components, such as voltage regulators and fans. The
sensors are implemented on a per-processor basis.