User`s guide

15 – SANblade Control FX Application for Solaris
Configurating the HBA
15-30 FC2354601-00 E
Q
read/write is also compared. If errors occur, the test indicates a broken or unreliable
link between the HBA and the device (see figure 15-20).
Figure 15-20. Diagnostics Tabbed Page (Read/Write Buffer Test)
To perform a loopback or a read-write buffer test, fill in the following options in the
Diagnostics tabbed page:
n Data Pattern. This option sets the test pattern. You can select a predefined
eight-byte data pattern, specify your own eight-byte custom pattern, or select
Random Data Pattern. To select your own test data, select Customized from
the drop-down list and enter the data in hex format (0x00–0xFF) into the boxes.
When you select Random Data Pattern, a new random eight-byte pattern is
sent to the devices and/or the HBA, depending on which test is selected
(loopback or read/write buffer).
n Number of Tests. This option sets the total number of test to run. You can enter
a test number between 1 and 10,000 in the Number of Tests box, or select the
Test Continuously check box. If you select Test Continuously, the number of
tests that are run repeatedly is set to 125. If you select Test Continuously but
want to stop the test when an error is encountered, select the Stop on error
check box. If you select Test Continuously, a dialog box with a Stop button is
displayed when the test is running. To stop testing, press the Stop button.