Specifications

EMC-CS-2009.1
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February 11, 2010
the time it takes to move to the next frequency and initiate the leveling procedure (Stage 1). This is hardware and/or test
software dependent.
Figure B-2: RF Immunity Generic Leveling/Dwell Process
Stage
1
A
B
U
START
U
CAL
t
Stage
2
Stage
3
Figure B-3: RF Immunity Example of Combined CW and AM Dwell
CW
U
START
U
CAL
AM
Stage
3
Stage
2
Stage
1
Key
Stage 1: Leveling Stage U
START
: Initial Stress Level : >10 dB below U
TARGET
Stage 2: Dwell Stage (default 2 secs) U
TARGET
: Target Stress Level
Stage 3: Stress Removed. Switch to next frequency
(hardware/ software dependent)
A: Stress Increment (may be fixed or variable)
t: time required to measure RF power
(hardware\software dependent)
B: Post Dwell Level: > 10 dB below U
TARGET
of next test
frequency
B3 DUT Functional Deviation Threshold Procedure
Determination of DUT functional deviation (anomaly) threshold levels shall be accomplished using the following procedure:
1
Reduced stress level until the DUT functional deviation disappears,
2
Increase the stress level by steps not exceeding 1 dB, until the functional deviation reappears.
3
Record the stress level from step 2 as the functional threshold level