Specifications

EMC-CS-2009.1
© Copyright Ford Motor Company – All Rights Reserved Page 71 of 121
February 11, 2010
18.3 Test Procedures
The waveforms shall be applied to one ground circuit at a time unless analysis demonstrates that testing each circuit
individually is unnecessary. The analysis shall be documented in the EMC test plan and approved by the FMC EMC
department prior to commencement of testing.
18.3.1 Procedure for Continuous Disturbances
a) Connect the DUT and verify that it is functioning correctly in the operating mode specified in the EMC test plan.
b)
At each test frequency increase U
S
to the corresponding stress level listed in Figure 18-1 while the DUT is operating.
• Dwell time shall be at least 2 seconds. A longer dwell time may be necessary if DUT function response times
are expected to be longer. This information shall be documented in the EMC test plan
c)
Monitor DUT function for any anomalies. If anomalies are noted, reduce the stress level to the point where normal
DUT function resumes. Record the measured value of U
S
where this threshold occurs.
d)
Repeat Steps b) and c) using the frequency steps listed Table 18-3.
e)
Repeat testing for all DUT operating modes listed in the EMC test plan.
Table 18-3: CI 250 Test Frequency Requirements
Test Frequency Range (kHz) Frequency Step (kHz)
2 - 10 0.5
10 - 100 5
18.3.2 Procedures for Transient Disturbances
a) Connect the DUT and verify that it is functioning correctly in the operating mode specified in the EMC test plan.
b)
Apply the test sequence shown in Figure 18-4 while the DUT is operating. Adjust the pulse amplitude (U
S
) to the
level shown in Figure 18-2 The waveform shall be symmetrical about zero volts (peak to peak value = 2U
S
).
c)
The test sequence shall be applied repeatedly for 60 seconds. During application of the sequence, monitor DUT
function for any anomalies. If anomalies are noted, reduce the stress level to the point where normal DUT function
resumes. Record the measured value of
U
S
where this threshold occurs.
d)
Repeat testing for all DUT operating modes listed in the EMC test plan.