Specifications
EMC-CS-2009.1
© Copyright Ford Motor Company – All Rights Reserved Page 32 of 121
February 11, 2010
11.3 Generic Test Procedures
• RF Immunity testing shall be performed with linear frequency step sizes no greater than those listed in Table 11-2.
• Peak conservation shall be used per ISO 11452-1. CW and modulation (AM & Pulsed) dwell times shall be a
minimum of 2 seconds. Longer dwell times may be necessary if DUT function response times are expected to be
longer. This information shall be documented in the EMC test plan.
• Amplifier output harmonics content shall conform to the requirements of ISO 11452-1 (2005). Field modulation and
leveling shall conform to the requirements delineated in Annex B.
• The AM modulation frequency shall be 1 kHz at a level of 80%.
• Testing shall be initially performed using Level 2 requirements. If deviations are observed, the stress level shall be
reduced until the DUT functions normally. The stress level shall then be increased until the deviation occurs. The
stress level at this point shall be verified to meet the performance requirements delineated in Table 11-1. If the
performance requirements are not met, the stress level shall be reported as the deviation threshold.
Table 11-2: RF Immunity Test Frequency Steps
Frequency Range
(MHz)
Frequency Step Size
(MHz)
1 - 30 0.5
30 - 200 2
200 - 400 5
400 - 1000 10
1000 - 3100 20