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General Specification

Electrical/Electronic

EMC-CS-2009.1

February 11, 2010

Printed copies are uncontrolled

Electromagnetic Compatibility Specification

For Electrical/Electronic

Components and Subsystems

Foreword

This engineering specification addresses Electromagnetic Compatibility (EMC) requirements for

electrical/electronic (E/E) components and subsystems for Ford Motor Company (FMC). This

specification is the direct link from ARL-09-0466. These requirements have been developed to assure

compliance with present and anticipated regulations in addition to customer satisfaction regarding the

EMC of vehicle E/E systems. This specification replaces ES-XW7T-1A278-AC.

EMC-CS-2009 is applicable for all E/E components/subsystems slated for use on 2013 Ford vehicle

programs in addition to E/E component/subsystems whose commercial agreements are signed after

October 1, 2009.

EMC-CS-2009 is available for download from the Ford EKB

in addition to www.fordemc.com

Corrections and/or editorial updates to this specification will be made as required and without prior

notification to the user. It is recommended that the user verify they have the latest version of the

specification prior to application to their E/E component/subsystem.

Information regarding differences between these specifications may be found at http://www.fordemc.com

Date Version Revision

9/30/2009 0 Initial Release of Specification

2/11/2010 1

Annex I updated to correct errors in measurement procedure

RE 310 flow chart corrections

CE 410 trigger setting correction

CI 280 requirements for metallic connectors

Corrections in tolerance requirements for certain tests

Numerous editorial corrections.

Corrected errors in Tables 16-1 and F-1 to align requirements.

Updates to Figures G-1 and G-3 in Annex G.

Requirement revisions for Artificial Networks

Summary of content (121 pages)

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General Specification Electrical/Electronic EMC-CS-2009.1 Electromagnetic Compatibility Specification For Electrical/Electronic Components and Subsystems Foreword This engineering specification addresses Electromagnetic Compatibility (EMC) requirements for electrical/electronic (E/E) components and subsystems for Ford Motor Company (FMC). This specification is the direct link from ARL-09-0466.
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EMC-CS-2009.1 Table of Contents: Foreword......................................................................................................................................................................................1 1.0 Scope ...............................................................................................................................................................................6 2.0 References......................................................................................
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EMC-CS-2009.1 Figure 11-2: RI 112 DUT Harness Configurations...................................................................................................................35 Figure 11-3: RI 114 ALSE Test Setup (1000 – 2000 MHz) excluding Bands 6 and 7.............................................................37 Figure 11-4: RI 114 ALSE Test Setup for Bands 6 and 7 .........................................................................................................39 Figure 11-5: RI 115 Test Setup.
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EMC-CS-2009.1 Figure A-1: Field Probe (Type A) Positioning Requirements (RI 114, Bands 6 and 7) ...........................................................88 Figure A-2: Field Probe (Type B) Positioning Requirements (RI 114, Bands 6 and 7) ...........................................................89 Figure A-3: Receive Antenna Positioning Requirements (RI 114, Bands 6 and 7) ...................................................................90 Figure B-1: RF Immunity Peak Conservation Profile..............
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EMC-CS-2009.1 Table 11-2: RF Immunity Test Frequency Steps .......................................................................................................................32 Table 11-3: RI 114 Requirements ( 400 – 3100 MHz ) ............................................................................................................36 Table 11-4: RI 115 Requirements for hand portable transmitters.............................................................................................
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EMC-CS-2009.1 1.0 Scope This engineering specification defines the Electromagnetic Compatibility (EMC) requirements, test methods and test procedures for electrical/electronic (E/E) components and subsystems used by Ford Motor Company (FMC) including associated vehicle brands. 1.1 Purpose of the Specification The purpose of this engineering specification is to ensure vehicle Electromagnetic Compatibility.
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EMC-CS-2009.1 5. 6. 7. Perform testing at a FMC recognized test facility. Submit the test results to the FMC EMC department. See section 5.7 for reporting requirements. EMC department reviews and assesses the test results. It’s important to emphasize that the FMC D&R group and their supplier (not the FMC EMC department) are responsible for determining the operating modes and acceptance criteria for their component or subsystem (step 3).
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EMC-CS-2009.
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EMC-CS-2009.1 Disturbance. Any electrical transient or electromagnetic phenomenon that may affect the proper operation of an electrical or electronic device (see stimulus). DBCI. Differential Mode Bulk Current Injection. DUT. Device(s) Under Test. Any electrical or electronic component, module, motor, filter, etc being tested. DV. Design Verification (components not constructed from production tooling). E/E. Electrical and/or Electronic. EMC. Electromagnetic Compatibility EMI.
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EMC-CS-2009.1 Inductive Device. An electromechanical device that stores energy in a magnetic field. Examples include, but not limited to solenoids, relays, buzzers, and electromechanical horns. Informative. Additional (not normative) information intended to assist the understanding or use of the specification. I/O. Input and output. Also used in this document to designate the transient pulse testing on I/O-lines. MBW. Measurement System Bandwidth Memory (temporary or permanent).
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EMC-CS-2009.1 4.0 Common Test Requirements • Attention shall be directed to control of the RF boundary in both emission and immunity tests to reduce undesired interaction between the DUT, the Load Simulator and the electromagnetic environment. • The test equipment, test setups and test procedures shall be documented as part of the test laboratory’s procedures. FMC reserves the right to inspect the lab procedures.
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EMC-CS-2009.1 4.5.2 Tolerances. Unless indicated otherwise, the tolerances specified in Table 4.1 are permissible.
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EMC-CS-2009.1 The EMC test plan shall be prepared in accordance with the outline shown in EMC-P-2009. FMC reserves the right to review and challenge specific detail of the EMC test plan including specific acceptance criteria for immunity testing. When the test plan is accepted by FMC, a unique test plan number will be assigned. This test plan number will serve as reference for subsequent test results. Failure to obtain this test plan number prior to commencement of testing will invalidate the test results.
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EMC-CS-2009.1 Table 6-1: Requirement Selection Matrix Component Category Requirement Type RF Emissions Conducted AF Requirement Applies (3) Conducted Transients RF Immunity Magnetic Field Immunity Req.
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EMC-CS-2009.1 7.0 Radiated RF Emissions: RE 310 The requirements, delineated in Tables 7-1 and 7-2 are applicable to the following component categories: Electronic Modules: A, AS, AM, AX, AY, AW, EM 7.1 Requirement Radiated emissions requirements cover the frequency range from 0.15 to 1583 MHz. Requirements are linked directly to specific RF service bands, which are segregated into Level 1 and Level 2 requirements. Level 1 requirements are based on latest version of European directive 72/245/EEC .
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EMC-CS-2009.1 Table 7-2: RE 310 Level 2 Requirements Band # Region RF Service (User Band in MHz) Requirement Frequency Range (MHz) Limits (dBµV/m) Limit A PK (2, 3) Limit B AVG (2, 3,4) QP (2, 3) EU1 Europe Long Wave 0.15 - 0.28 35 53 G1 Global Medium Wave (AM) 0.53 - 1.
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EMC-CS-2009.1 7.2 Test Verification and Test Setup The requirements of CISPR 25 Edition 3, ALSE method, shall be used for verification of the DUT performance except where noted in this specification. Component operation during testing shall be documented in an EMC test plan prepared by the component/subsystem supplier and EMC test laboratory (see section 5.2). • Co-location of multiple receiving antennas in the same test chamber to support automated testing for reduced test times is not permitted.
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EMC-CS-2009.1 Figure 7-1: RE 310 Test Antenna Cable Configuration (excludes Rod antenna) ≥ 1000 ≥ 1000 1 ≤ 150 1 ≤ 150 2 2 3 3 Log Antenna Biconical Antenna Scale: millimeters Key: 1. Ferrite Cable Bead (Fair-Rite Type 43 or equivalent) 2. Preamplifier (if required) 3. Floor of ALSE Figure 7-2: RE 310 Test Setup (EU1, G1) DUTs with Selected Wiring in Engine Compartment 100 1 2 100 9 6 8 6 7 8 7 2 9 9 5 5 − + 3 4 > 100 8 Key 1. DUT 6. Ground Plane Bench 2.
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EMC-CS-2009.1 Rod Antenna Not Shown. Physical Dimensions conform to CISPR 25 3rd Edition Except where noted. Dimensions shown are in millimeters. 7.2.2 Measurement System Requirements The measurement receiver (spectrum analyzer or stepped receiver) shall be compliant to CISPR 16-1-1 as specified in section 4.4 of CISPR 25 3rd edition.
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EMC-CS-2009.1 Table 7-4: RE 310 Measurement System Setup Requirements (All Bands except M1, M2, M3, EU1, G1) Swept Receivers Detection Method Measurement Bandwidth (kHz) Stepped Receivers Limit A Limit B Limit A Limit B Peak or Average Quasi-Peak Peak or Average Quasi-Peak 9/10 (2) 120 9/10 (2) 120 ≥ 3*MBW n/a ≥ 0.003 ≥ 0.001 0.5*MBW 60 0.005 1 {MBW} Video bandwidth (kHz) Frequency sweep rate (sec/kHz) Frequency Step Size (kHz) Measurement Time per Frequency Step (sec ) (2) 1.
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EMC-CS-2009.1 7.3 Test Procedure a) Prior to measurement of DUT radiated emissions, test setup ambient levels (i.e. all equipment energized except DUT) shall be verified to be 6 db or more below the specified requirements listed in Table 7-2. If this requirement is not met, testing shall not proceed until the associated test setup issues are resolved. Plots of the test setup ambient shall be included in the test report.
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EMC-CS-2009.1 Figure 7-3: Recommended Process for Assessing DUT Emissions per RE 310 Level 1 Requirements Measure DUT Emissions from 30-1000 and 1447 -1494 MHz using 120 kHz MBW, PK+ detection and measurement system requirements listed in Table 7-5. Step 1 Level 2 Evaluation See Figure 7-4 Are all PK emissions below Level 1, Limit A per Table 7-1? N Limit A Step 2 Re-measure DUT emissions at all non-compliant frequencies in accordance with Table 7-5 for Limit A+.
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EMC-CS-2009.1 Figure 7-4: Recommended Process for Assessing DUT Emissions to RE310 Level 2 Requirements (Excludes bands EU1, G1, G8) Measure DUT Emissions from 30-1000 and 1447 -1494 MHz using 120 kHz MBW, PK+ detection and measurement system requirements listed in Table 7-5. Step 1 Level 1 Evaluation See Figure 7-3 Are all PK emissions below Level 2, Limit A (PK) per Table 7-2? N Limit A Step 2 Re-measure DUT non-compliant emissions in accordance with Table 7-4 for Limit A.
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EMC-CS-2009.1 8.0 Conducted RF Emissions: CE 420 These requirements are applicable to the following component categories: Electronic Modules: A, AS, AM Shall meet Average Limits only. Electronic Modules: AX, AY Shall meet both Average and Quasi Peak Limits. Electric Motors: EM Shall meet both Average and Quasi Peak Limits.
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EMC-CS-2009.1 8.2 Test Verification and Test Setup The requirements of CISPR 25 (Edition 3), voltage method shall be used for verification of the component performance except where noted in this specification. If the DUT has separate power/power return circuits, separate tests shall be performed on each circuit. Circuits not being tested shall be connected directly to an automotive battery.
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EMC-CS-2009.1 9.0 Conducted Emissions: CE 421 These requirements are applicable to the following component categories: Electronic Modules: A, AS, AM, AX, AY Electric Motors: EM 9.1 Requirement Conducted voltage emissions on all component power circuits shall not exceed the requirements listed in Table 9-1.
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EMC-CS-2009.1 Figure 9-2: CE 421 Test Setup 4 6 200 ± 50 3 + _ 1 2 7 5 Key: 1. 2. 3. 4. 5. Measurement Receiver 6. Ground Plane 7. Insulated Support (εr≤ 1.4) DUT Artificial Network Automotive Battery Load Simulator CE 421 requires application of a correction factor to the measured data to account for the insertion loss of the Artificial Network. Figure 9-2 illustrates 'typical' correction factor for a standard CISPR 25 artificial network.
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EMC-CS-2009.1 9.2.1 Measurement System Requirements The measurement receiver (spectrum analyzer or stepped receiver) shall be compliant to CISPR 16-1-1 as specified in section 4.4 of CISPR 25 3rd edition. Measurement receivers using Fast Fourier Transform (FFT) techniques may be used with prior approval from the FMC EMC department. A list of approved measurement systems may be found at: www.fordemc.com. Table 9-2 lists the measurement system requirements when using either a swept (i.e.
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EMC-CS-2009.1 10.0 Conducted Transient Emissions: CE 410 These requirements are applicable to the following component categories: Electronic Modules: AX, AY Electric Motors and Inductive Devices: BM, EM, R 10.1 Requirement The component shall not produce transient voltages magnitudes exceeding +75 / - 100 volts on its power supply circuit(s). 10.
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EMC-CS-2009.1 g) If the DUT is of component categories AX, AY and EM, measure and record the peak transient voltages while exercising the DUT functions in operating modes identified in the EMC test plan. This step may be omitted for component categories BM and R.
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EMC-CS-2009.1 11.0 RF Immunity: RI 112, RI 114, RI 115 Radiated immunity requirements cover the frequency range from 1 to 3100 MHz. Requirements are based on anticipated “off-vehicle” and “on-vehicle” RF sources (e.g. amateur radio, cellular phones).
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EMC-CS-2009.1 11.3 Generic Test Procedures • RF Immunity testing shall be performed with linear frequency step sizes no greater than those listed in Table 11-2. • Peak conservation shall be used per ISO 11452-1. CW and modulation (AM & Pulsed) dwell times shall be a minimum of 2 seconds. Longer dwell times may be necessary if DUT function response times are expected to be longer. This information shall be documented in the EMC test plan.
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EMC-CS-2009.1 11.4 Requirements 1 -400 MHz: RI 112 The device shall operate as specified in Table 11-1 when exposed to the RF current levels and modulation listed and illustrated in Figure 11-1. The currents are produced using the BCI test method. RI 112 can not be used for component category AW (no wire harness). Alternative methods may be used (e.g. TEM cell), but only with prior authorization by the FMC EMC department.
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EMC-CS-2009.1 11.4.1 Test Verification and Test Setup Verification of component performance shall be in accordance with the BCI (substitution method) per (ISO 11452-4) except where delineated in this specification. • The DUT shall be powered from an automotive battery (see paragraph 4.5.4 for requirements). The battery negative terminal shall be connected to the ground plane. The battery may be located on, or under the test bench.
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EMC-CS-2009.1 Figure 11-2: RI 112 DUT Harness Configurations _4 + 3 _4 + 1700 -0/+300 d 3 3 1700 -0/+300 d 3 10a 11 9 NC 2 1 9 2 12 12 Ground Plane 11 10b 1 12 12 Ground Plane 6 5 7 6 5 8 7 (a) DBCI 8 (b) CBCI Key: 1. DUT 8. Current Monitoring Equipment (OPTIONAL) 2. Load Simulator 9. DUT Wire harness 3. Artificial Network 10a. DUT Power Return removed from wire harness and connected directly to sheet metal. Wire length is 200 ±50 mm. 4.
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EMC-CS-2009.1 11.5 Requirements: 400 – 3100 MHz: RI 114 The device shall operate as specified in Table 11-1 when exposed to RF electromagnetic fields as delineated in Table 11-3. Table 11-3: RI 114 Requirements ( 400 – 3100 MHz ) Band Frequency Range (MHz) Level 1 (V/m) Level 2 (V/m) 4 400 - 800 50 100 5 800 - 2000 50 70 6 1200 - 1400 n/a 7 2700 – 3100 n/a Modulation CW, AM 80% Pulsed PRR= 18 Hz, PD= 28 msec (1) CW, Pulsed PRR= 217 Hz, PD=0.
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EMC-CS-2009.1 Figure 11-3: RI 114 ALSE Test Setup (1000 – 2000 MHz) excluding Bands 6 and 7 Upper View 11 11 12 1000 ± 10 1000 min 11 67 6 5 9 9 9 + + 50 ± 5 4 500 min 33 7 3 8 22 1500± 75 2000 min 10 200 ± 10 7 4 - 1 - Front View (Artificial Networks not shown) 13 100 ± 10 100± 10 900± 50 8 250 min Side View Key: 1. 2. 3. 4. 5. DUT Wire harness Load Simulator Automotive Battery Ground plane (bonded to shielded enclosure) 6. 7. Insulated support (εr≤ 1.
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EMC-CS-2009.1 11.5.1.2 ALSE Method (Bands 6 and 7) The test setup is illustrated in Figure 11-4 • A ground plane shall not be used for this test. • The battery may be located on, or under the test bench. • The DUT and its cable harness, along with the Load Simulator shall lie on an insulated support 1000 mm (+/-50 mm) above the floor of the test chamber. The dielectric constant of the insulated support shall be less than 1.4. • Artificial Networks shall not be used. 11.5.1.
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EMC-CS-2009.1 Figure 11-4: RI 114 ALSE Test Setup for Bands 6 and 7 1000 min 5 1 2 7 11 - 3 6 5 Front View 250 min 4 1000 ± 50 5 4 6 500 min 1 3 + 1000 ± 10 mm 3 + - 8 100 ± 10 100 ± 10 92 11 1500 ± 75 mm 12 10 1 Side View Key: 1. DUT 7. Support Equipment 2. Test Harness 8. Double Shielded Coaxial Cable (e.g. RG 223) 3. Load Simulator 9. Bulkhead Connector 4. Automotive Battery 10. RF Generation Equipment 5. Dielectric Support ((εr ≤ 1.4) 11.
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EMC-CS-2009.1 For both procedures, field characterization shall be performed at the Level 2 field strengths listed in Table 11-3. Field characterization at lower field strengths with subsequent power scaling for higher field strengths is not permitted. When performing testing in Bands 6 and 7, the forward power required to achieve the field strengths listed in Table 11-3 is greatly influenced by the transmit horn antenna selected.
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EMC-CS-2009.1 11.6 Requirements: RF Immunity to hand portable transmitters: RI 115 The device shall operate as specified in Table 11-1 when exposed to RF electromagnetic fields as delineated in Table 11-4. RI 115 is based on the potential risk of modules being exposed to hand portable transmitters (e.g. cell phones). Specific applicability shall be agreed with the FMC EMC department prior to testing and documented in the test plan.
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EMC-CS-2009.1 • The DUT shall be powered from an automotive battery (see paragraph 4.5.4 for requirements). The battery negative terminal shall be connected to the ground plane. The battery may be located on, or under the test bench. See Annex G regarding the standard test Setup for the Load Simulator, battery and Artificial Networks. • The test harness shall be 1700 mm (+ 300/- 0 mm) long and routed 50 mm above the ground plane on an insulated support (εr ≤ 1.
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EMC-CS-2009.1 11.6.2 Test Procedure Prior to testing, calibration of test setup shall be performed using a similar procedure to that delineated in Annex B of ISO 11451-3-2006. During calibration, the antenna shall be positioned such that its radiating elements are a minimum distance of 500 mm from any absorber material and 1000 mm from any object such as the DUT, the ground plane, antenna cable, and the test enclosure wall. This setup is illustrated in Figure 11-6.
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EMC-CS-2009.1 The methodology for selection of surfaces and harnesses to be tested, in addition to antenna to DUT test distance and antenna positioning steps is delineated in sections 11.6.2.1 and 11.6.2.2 below. This information shall be documented in the EMC test plan. 11.6.2.1 Antenna Positioning for Coupling to DUT The usable test area of the broadband antenna is 100x100 mm when testing at a DUT-to-antenna separation of 50 mm. However, the footprint reduces to 30x30 mm when testing at 5 mm separation.
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EMC-CS-2009.1 e) Repeat step d) with antenna rotated 90 degrees f) Repeat steps (d) and (e) until all cells have been exposed. When testing DUTs with multiple cells, centers of some cells will be exposed to the elements of the antenna while performing steps (a) to (c) to the adjacent cell. In such cases, it is not required to carry out steps (d) and (e) that would result in a duplicate test.
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EMC-CS-2009.1 12.0 Magnetic Field Immunity: RI 140 Magnetic field immunity requirements cover the frequency range from 50 Hz to 100 kHz. Requirements are based on anticipated “off-vehicle” electromagnetic sources (e.g. AC power lines) in addition to “on-vehicle” sources (e.g. charging system, PWM sources). These requirements are applicable to the following component categories: Electronic Modules: AM 12.
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EMC-CS-2009.1 12.2 Test Verification and Test Setup Verification of component performance shall be verified using the test method delineated in MIL-STD-461E, RS101 except where noted in this specification. The test setup shall be configured to facilitate direct exposure of the DUT to the fields listed in Figure 12-1 in addition to magnetic field exposure to any magnetic sensors that may be connected to the DUT.
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EMC-CS-2009.1 Figure 12-2: RI 140 Magnetic Immunity Test Setup: Radiating Loop 1 5 cm 2 1 5 3 4 6 2 8 3 7 4 Configuration for Testing DUT only 5 cm 9 5 6 8 7 Configuration for Testing DUT with attached Magnetic Sensors Key: 1. 2. 3. 4. 5. Radiating Loop Signal Source Current Probe Measurement Receiver DUT 6. 7. 8. 9. Load Simulator Artificial Network Ground Plane Magnetic Sensor 12.3.
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EMC-CS-2009.1 Figure 12-3: RI 140 Magnetic Immunity Test Setups for Helmholtz Coil 8 8 9 9 6 R 6 R 1 4 5 1 7 5 R 4 3 3 RR>>50 5 cm mm 2 7 10 R RR>>50 5 mm cm 2 Configuration for Testing DUT only Configuration for Testing DUT with attached Magnetic Sensors Key: 1. 2. 3. 4. 5. Radiating Loop A Signal Source Current Probe Measurement Receiver DUT © Copyright Ford Motor Company – All Rights Reserved February 11, 2010 6. 7. 8. 9. 10.
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EMC-CS-2009.1 13.0 Coupled Immunity: RI 130 These requirements are related to component immunity from wire-to-wire coupling of unintended transient disturbances. These disturbances originate from switching of inductive loads including solenoids and motors. These requirements are applicable to the following component categories: Electronic Modules: A, AS, AM, AX, AY Electric Motors: EM 13.
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EMC-CS-2009.1 Figure 13-1: RI 130 Default Test Setup 11 11 + 6 _ C 9 9 D 1000 -0/+25 * ** 8 + 5 _ 4 > 200 mm 2a 3 4 8 1 2b 10 Detail 7 Key 1 DUT 7 DUT Monitor/Support Equipment 2a DUT Circuit Wire to be Tested 8 Coupling Test Fixture 2b DUT Wire Harness 3 9 Transient Generator (see Annex F for details). Generator connected to Coupling test fixture via coaxial cable. Case of generator connected to the ground plane.
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EMC-CS-2009.1 13.3 Test Procedures Testing shall be repeated for all DUT operating modes listed in the EMC test plan. a) b) c) d) e) f) g) h) i) Configure the transient generator for Mode 3, Pulse A2-1 (see Annex F). Close SW0 to activate the transient generator. Using the oscilloscope, capture at least one complete transient sequence (see Figure D-12). Verify magnitude of the negative transient voltage disturbance measured at the test point (see Figure 13-1) is greater than 300 volts.
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EMC-CS-2009.1 14.0 Coupled Immunity: RI 150 These requirements are related to component immunity from wire-to-wire coupling of unintended continuous disturbances. These disturbances originate from high current PWM sources and the vehicle’s charging and ignition system. These requirements are applicable to the following component categories: Electronic Modules: A, AS, AM, AX, AY Electric Motors: EM 14.
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EMC-CS-2009.1 14.2 Test Verification and Test Setup Verification shall be performed using the test Setup shown in Figures 14-2. Except where noted in Figure 14-2, the setup of the DUT, Load Simulator and test harness is identical to that used for RI 130.
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EMC-CS-2009.1 14.3 Test Procedures Testing shall be repeated for all DUT operating modes listed in the EMC test plan. a) Activate the DUT and verify that it is functioning correctly. b) Place an individual DUT circuit wire or wire pairs (i.e. twisted wire pair) in the test fixture (circuit placement requirements are identical to RI130). b) At each test frequency increase the peak to peak current to the corresponding stress level listed in Figure 14-1. Use the frequency steps listed in Table 14-1.
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EMC-CS-2009.1 15.0 Immunity from Continuous Power Line Disturbances: CI 210 The device shall be immune from continuous disturbances that occur on the vehicle’s low voltage (i.e. 13.5 VDC) electrical distribution system. These requirements are applicable to the following component categories: Electronic Modules: A, AM, AX, AY Electric Motors: EM 15.1 Requirements The devices shall operate in accordance to the requirements delineated in Figure 15-1.
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EMC-CS-2009.1 15.2 Test Verification and Test setup Testing shall be performed using the test setup shown in Figure 15-2. The test harness connecting the DUT to the Load Simulator and modulated DC supply shall be < 2000 mm in length. All DUT power/power return circuits shall be connected together at the modulated power supply.
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EMC-CS-2009.1 Figure 15-3: CI 210 AC Stress Level (US) Superimposed on DUT Supply Voltage (UP) UP US 0 Table 15-1: CI 210 Test Frequency Requirements Test Frequency Range (kHz) Frequency Step (kHz) 0.05 - 1 0.05 > 1 - 10 0.
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EMC-CS-2009.1 16.0 Immunity from Transient Disturbances: CI 220 These requirements are related to immunity from conducted transients on power and control circuits connected directly to the vehicle's battery or indirectly by a switch or load (e.g. pull-up resistor). These requirements are applicable to the following component categories: Electronic Modules: A, AM, AX, AY Electric Motors: EM Passive Devices: P (requirement may be waived via analysis. See section 6.0) 16.
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EMC-CS-2009.1 16.2 Test Verification and Test Setup Verification of component performance shall be in accordance with ISO 7637-2 except where noted in this specification. • Test pulses A, B, and C shall be generated using the transient generator described in Annex F. • Test pulses E, F and G shall be generated using a transient generator conforming to the requirements of ISO 7637-2. • The test setup for application of Pulse G1 requires that a 0.
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EMC-CS-2009.1 Figure 16-2: CI 220 Test Setup for Devices with Two Power Supply Connections Battery + U - 1 Test Fixture DUT U Test Pulse Generator 2 Insulator Ground Plane Denotes Connection To Ground Plane Figure 16-3 illustrates the setup used for testing of input circuits. These circuits may be directly or indirectly connected to switched battery circuits.
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EMC-CS-2009.1 Figure 16-4: CI 220 Test Setup Detail (Input Circuits with Remote External Pull-Up Resistor) Test Fixture A < 200 mm A DUT Test Pulse Generator Ground Plane Denotes Conn ection To Groun d Plane Insulator Figure 16-5: CI 220 Test Setup for Application of Pulse G1 Transient Pulse Generator R DUT DUT Test Fixture R= 0.5 ohms Figure 16-6: CI 220 Test setup for Application of Pulse G2 "Z" 1 Transient Pulse Generator Z R Test Fixture DUT DUT 2 R= 0.5 ohms 1.
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EMC-CS-2009.1 16.3 Test Procedures Test pulses shall be applied to power supply and input circuits in accordance with the requirements delineated in Annex E and documented in the EMC test plan. a) Prior to testing: • For Pulses G1 adjust the transient generator to the voltage level listed in Figure D-9 of Annex D with the DUT and "R" disconnected (open circuit condition). Pulse measurement shall be facilitated using an oscilloscope and voltage probe meeting the requirements delineated in ISO 7637-2.
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EMC-CS-2009.1 17.0 Immunity from Power Cycling: CI 230 These requirements are applicable to the following component categories: Electronic Modules: A, AM, AX, AY Electric Motors: EM 17.1 Requirements The component shall be immune from voltage fluctuations, which occur during initial start of the vehicle’s engine under cold temperature conditions. This requirement is not representative of conditions where a warm engine is restarted.
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EMC-CS-2009.1 Figure 17-1: CI 230 Power Cycling Waveforms and Timing Sequence U4 U3 T1 A 0V T8 T2 U4 U3 T9 B U5 U2 U1 0V T6 T3 T7 U4 U3 T1 C U5 U2 U1 0V T4 T2 U4 U3 T5 D U5 U2 U1 0V T4 Key T1 = 100 msec T2 = 5 msec T3 = 185 msec T4 =15 msec T5 = 50 msec T6 = 10 sec T7 = 500 msec © Copyright Ford Motor Company – All Rights Reserved February 11, 2010 T8 = 11 sec T9 = 325 msec U1 = 5 V U2 = 9 V U3 = 12.5 V U4 = 13.
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EMC-CS-2009.1 Figure 17-2: CI 230 Power Cycling Test Setup Ground Plane Signal Source A A Signal Source B B Signal Source C C Signal Source D Power + Supply - DUT D Test Fixture Insulator Thermal Chamber Signal Source Detail Arbitrary Waveform Generator 17.3 DC Coupled Audio Amplifier Test Procedures All waveforms shall be applied simultaneously to all power supply and control circuits in accordance with the timing sequence shown in Figure 17-1.
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EMC-CS-2009.1 18.0 Immunity to Ground Voltage Offset: CI 250 Components shall be immune from AC ground offset voltages. disturbances. Requirements include both continuous and transient These requirements are applicable to the following component categories: Electronic Modules: A, AM, AX, AY Electronic Controlled Electric Motors: EM 18.1 Requirements Component functional performance shall meet the acceptance criteria delineated in Table 18-1.
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EMC-CS-2009.1 Figure 18-2: CI 250 Transient Pulse Detail US exp(-πft/10)sin(2πft) 0 - US 1/f 2/f 3/f 10/f F(Hz) = 100x103 (100 kHz) US = 5 volts ( peak to peak voltage = 2US ) Figure 18-3: CI 250 Transient Pulse Delay Detail dn Figure 18-4: CI 250 Requirements (Transient Disturbance Sequence) See Pulse Detail US 0 - US d1 d2 d3 d4 d5 . © Copyright Ford Motor Company – All Rights Reserved February 11, 2010 . . . . . .
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EMC-CS-2009.1 Table 18-2: CI 250 Delay Time Sequences 1 - 4 Sequence 1 Sequence 2 Sequence 3 Sequence 4 d1 0.1 ms d6 0.4 ms d11 0.2 ms d16 0.1 ms d2 0.5 ms d7 0.3 ms d12 0.3 ms d17 0.1 ms d3 0.2 ms d8 0.4 ms d13 0.6 ms d18 0.3 ms d4 0.7 ms d9 0.6 ms d14 0.5 ms d19 0.4 ms d5 0.5 ms d10 0.6 ms d15 0.3 ms d20 0.2 ms d1 0.2 ms d6 0.8 ms d11 0.4 ms d16 0.2 ms d2 1.0 ms d6 0.6 ms d12 0.6 ms d17 0.2 ms d3 0.4 ms d8 0.8 ms d13 1.2 ms d18 0.
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EMC-CS-2009.1 Figure 18-5: CI 250 Test Setup for Ground Offset of DUT 10 10 6 6 + + 1 8 8 7 5 1 A 7 5 _ _ A 2 2 B 9 B 4 3 4 3 a) b) Key: 1. 2. 3. 4. 5. DUT Signal Source (see Figure 18-5) Ground Plane Load Simulator DUT External Load 6. 7. 8. 9. 10. Artificial Network Power Supply (13.
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EMC-CS-2009.1 18.3 Test Procedures The waveforms shall be applied to one ground circuit at a time unless analysis demonstrates that testing each circuit individually is unnecessary. The analysis shall be documented in the EMC test plan and approved by the FMC EMC department prior to commencement of testing. 18.3.1 Procedure for Continuous Disturbances a) Connect the DUT and verify that it is functioning correctly in the operating mode specified in the EMC test plan.
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EMC-CS-2009.1 19.0 Immunity to Voltage Dropout: CI 260 These requirements are applicable to the following component categories: Electronic Modules: A, AS, AM, AX, AY Electronic Controlled Electric Motors: EM 19.1 Requirements The component shall be immune from momentary voltage dropouts, which may occur over the life of the vehicle. Circuits affected include all power supply and control circuits.
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EMC-CS-2009.1 Figure 19-1: CI 260 Waveform A (Voltage Dropout: High) UP 10T 9T 7T 8T T 2T 0V Key: Power from Vehicle Battery Regulated Power from another Module 13.5 VDC Nominal Supply Voltage (e.g.
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EMC-CS-2009.1 Figure 19-3: CI 260 Waveform C (Single Voltage Dropout) UP 0V T Key: Power from Vehicle Battery Regulated Power from another Module 13.5 VDC Nominal Supply Voltage (e.g. 5 Vdc, 3 Vdc) UP T (1) 100 us 300 us 500 us 100 us 300 us 500 us (1) Waveform transition times are approximately 10 us Figure 19-4: CI 260 Waveform D (Voltage Dip) UP 10T U1 T 9T T 8T 7T T T T 2T T T T T 0V Key: Power from Vehicle Battery Regulated Power from another Module UP 13.
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EMC-CS-2009.1 Figure 19-5: CI 260 Waveform E (Battery Recovery) UP U1 0V 10 s 10 min Key: UP = 12.5 VDC U1 = 5 V Figure 19-6: CI 260 Waveform F (Random Bounce) 100 ms 100 ms See Detail in Figure 19-7 UP UP ... 0V 2.
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EMC-CS-2009.1 Figure 19-7: CI 260 Waveform F (Expanded) 20 15 Volts 10 5 0 -5 24 25 25 26 26 27 27 28 28 msec 19.2 Test Verification and Test Setup Testing shall be performed using the test Setups shown in Figure 19-8 through 19-10. The test harness connecting the DUT to the Load Simulator and transient pulse generator shall be < 2000 mm in length.
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EMC-CS-2009.1 Figure 19-9: CI 260 Test Setup Detail for Waveforms D and E Oscilloscope Signal Waveform Source Generator DUT DUT Test Fixture Signal Source Detail DC Coupled Audio Amplifier Arbitrary Waveform Generator Figure 19-10: CI 260 Test Setup for Waveform F Relay NC NC + Signal Source 1 _ + DUT Signal Source 2 _ Signal Source 1 Detail Programmable Power Supply T2 Signal Source 2 Detail Programmable Power Supply T1 Up T1 T2 Up T3 T4 Key: Up = 13.
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EMC-CS-2009.1 19.3 Test Procedures • Adjust DC offset of the signal generator/audio amplifier to 13.5 volts with the DUT disconnected (open circuit). • Prior to testing, measure and verify that the test waveforms A, B, C, D and E match those waveforms illustrated in section 19.2. For waveform F, measure and verify that the test waveform voltages are similar to that illustrated in Figure 19-6 and 19-7. All measurements shall be made with the DUT disconnected from the waveform generator.
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EMC-CS-2009.1 20.0 Immunity to Voltage Overstress: CI 270 These requirements are applicable to the following component categories: Electronic Modules: A, AM, AX, AY Electronic Controlled Electric Motors: EM Electric Motors: BM Passive Modules and Inductive Devices: P, R 20.1 Requirements The component shall be immune from potential voltage overstress. This requirement is applicable to all power supply or control circuits, either switched to, or directly connected to battery.
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EMC-CS-2009.1 21.0 Electrostatic Discharge: CI 280 The component shall be immune from overstress due to Electrostatic Discharge (ESD). These requirements are applicable to the following component categories: Electronic Modules: A, AS, AM, AX, AY, AW Electric Motors: Categories EM Passive Modules: P ** ESD Testing shall be performed prior to any other EMC validation testing ** 21.1 Requirements • The component shall be immune to ESD events that occur during normal handling and assembly.
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EMC-CS-2009.
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EMC-CS-2009.1 If the DUT has remote inputs that are accessible by the operator (e.g. switches) or communications bus circuits accessible via diagnostic connectors the associated circuit wires shall be split out of the main harness and terminated with representative switches and/or connectors (See Figure 21-2. Wiring for communication bus circuits (e.g. CAN) shall be configured such that the wiring is routed and connected directly to DUT. This requirement is illustrated in Figure 21-3.
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EMC-CS-2009.1 Figure 21-2: CI 280 ESD Powered Test Setup 13 3 22 1 4 12 2 6 10 5 9 8 8 7 11 2 12 Key 1. 2. 3. 4. 5. 6. 7. 21.3 DUT ESD Simulator Load Simulator Battery Remote Switch and/or Diagnostic Connector Ground Plane Wooden Bench 8. 9. 10. 11. 12. 13.
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EMC-CS-2009.1 Figure 21-3: CI 280 Test setup ( Communication Bus Connection Requirements ) 1 2 4 3 5 Key 1. DUT 4. 2. 3. Load Simulator Diagnositic Connector (e.g. OBDII) 5. Diagnositic Wiring (e.g. CAN) wiring shown is twisted and same length as DUT harness. Other DUT circuits 21.3.1 Handling (Unpowered) Tests Prior to testing, the DUT shall be configured as delineated in section 21.2.
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EMC-CS-2009.1 d) Repeat steps b) and c) for DUT remote inputs that are accessible by the operator (e.g. switch inputs). A representative switch may be used, but shall be approved by the FMC EMC department in writing prior to commencement of testing. e) Repeat step b), sequence 1 through 6 for DUT communications bus circuits accessible via diagnostic connectors. Apply contact and air discharges directly to the connector pins as illustrated in Figure 21-2.
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EMC-CS-2009.1 Annex A (Normative): Field Calibration Procedure for ALSE Method Bands 6 and 7) Due to the need for accurate generation of the high field strengths for Bands 6 and 7, field characterization shall be facilitated using the procedures outlined in this annex. These procedures replace those delineated in ISO 11452-2. This characterization procedure allows for use of either CW E-field probes or a receive antenna (DRG horn).
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EMC-CS-2009.1 A.3 Antenna Method Figure A-6 illustrates the setup when using a receiving antenna for field characterization. This method may be used when using either CW or pulsed amplifiers. This method requires use of any of the following as the receive antenna: • • • ETS Lindgren DRG 3115 Antenna Research: DRG 118/A Rohde & Schwarz: HF906 Use of alternative antennas shall be approved by the FMC EMC group.
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EMC-CS-2009.
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EMC-CS-2009.
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EMC-CS-2009.1 Annex B (Normative): Modulation and Leveling Requirements for RI 112, RI 114 and RI 115 B1 Peak Conservation Peak Conservation, per Annex B of ISO 11452-1 (2005) shall be used for application of AM and Peak modulation during radiated immunity testing (see section 11). Peak conservation is illustrated in Figure B-1. Peak conservation shall be verified via physical measurement as part of the EMC laboratory's calibration process.
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EMC-CS-2009.1 the time it takes to move to the next frequency and initiate the leveling procedure (Stage 1). This is hardware and/or test software dependent.
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EMC-CS-2009.1 Annex C (Normative): Mode Tuning Chamber Calibration C1 Mode Tuning Chamber Calibration (Based on IEC 61000-4-21) C1.1 Chamber Calibration and Loading Validation The empty chamber calibration shall be performed prior to the use of the chamber for testing using the procedures of this Appendix. Prior to each DUT test, a loading validation shall be performed according to the procedures of C2. All calibrations are antenna specific.
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EMC-CS-2009.1 j) Above 4000 MHz (10⋅fs), only three antenna locations and electric field probe positions must be evaluated. Repeat steps e) through g) for the remainder of the calibration frequencies as indicated in Table C1. One of the probe locations shall be the center of the working volume and one of the antenna positions shall be the typical receive antenna position as described in step i).
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EMC-CS-2009.1 p) For each frequency below 10 fs, verify that the chamber meets the field uniformity requirements by the following procedure: q) Field uniformity is indicated by the standard deviation from the mean value of the maximum electric field values obtained at each of the probe location during one complete rotation of the tuner. This standard deviation is calculated from data for each probe axis independently and the total data collected.
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EMC-CS-2009.1 The chamber meets the field uniformity requirements if the standard deviation from the individual axes (x, y, and z), and the total data set (all axes) are less than 3 dB (a maximum of three frequencies per octave may exceed the allowed standard deviation by no greater than 1 dB). C1.1.2 Receive Antenna Calibration The receive Antenna Calibration Factor (ACF) for an empty chamber is established to provide a comparison with a loaded chamber.
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EMC-CS-2009.1 C2 Calibration and DUT Loading Check The following procedure shall be performed prior to each test of the DUT. The DUT and any necessary supporting equipment must be installed into the chamber. If the chamber was initially tested under maximum loading conditions, the loading check prior to each test is optional. a) Place the receive antenna within the working volume (see C1.1.1 j)) at least 0.25 m from the DUT and supporting equipment.
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EMC-CS-2009.1 Where: ηTx, ηRx = Antenna efficiency factors for the transmit and receive antenna which can be assumed to be 0.75 for a log periodic antenna and 0.9 for a horn antenna. V = Chamber volume (m3) λ = Wavelength at the specific frequency CCF = Chamber Calibration Factor If the CLF was assumed to be one (1) from step C2 g), the ACF from C1.1.2 shall be used in place of the CCF when computing chamber Q.
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EMC-CS-2009.
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EMC-CS-2009.1 Annex D (Normative): CI 220 Transient Waveform Descriptions CI220 transient immunity testing consists of both standard pulses as delineated in ISO 7637-2 in addition to non-standard pulses including those produced by electromechanical switching of an inductive load. These non-standard transient pulses have been included to produce transient waveforms that are absent in ISO 7637-2, but are prevalent in the vehicle’s electrical power distribution system.
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EMC-CS-2009.1 When the external circuit is predominately capacitive, the transient produced (Pulse A2-2) is significantly different than Pulse A2-1. When the switch contacts open, a damped sinusoidal transient (fres ~ 2kHz) is produced. When the switch contacts bounce during closure a higher frequency, damped sinusoidal transient (fres ~180kHz) is produced. During this phase, there is a corresponding current transient with a magnitude approximately 30 AP-P (see Figure D-4c).
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EMC-CS-2009.1 Figure D-4: CI 220 Pulse A2-2 Pulse Characteristics 200 150 Contact Make 100 Volts 50 -50 -100 200 -150 150 100 -200 50 -250 -150 0 Volts Contact Break 0 -100 -50 0 50 100 150 usec -50 -100 b) Contact Bounce (Voltage) -150 -200 200 20 -250 150 15 -300 -1.0 -0.5 0.0 0.5 1.0 1.5 2.0 2.5 50 5 Volts Amperes msec a) Contact Break Contact Make 10 100 3.
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EMC-CS-2009.1 Figure D-5: CI 220 Pulse C Characteristics 300 200 150 200 Contact Make 100 100 Volts Volts 50 0 -100 Contact Break 0 -50 -100 -200 -150 -300 -200 -250 -400 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 -150 4.0 -100 -50 usec 0 a) Pulse A2-1 100 150 c) Pulse A2-2 300 200 150 200 Contact Make 100 100 50 0 Volts Volts 50 usec -100 0 -50 -100 -200 -150 -300 -200 -400 0.0 0.5 1.0 1.5 2.0 2.5 3.0 usec b) Pulse C-1 3.5 4.
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EMC-CS-2009.1 Figure D-6: CI 220 Pulse E Characteristics Pulse E - Parameters Up 13.5 V Us -100 V tr 1 us td 2 ms t1 5s t2 200 ms t3 ≤ 100 us Ri 10 ohms t2 V t3 UUPA 0V t 10 % Us 90 % ------------------------------------------tr Waveform voltage begins and ends at Up td Parameters listed are for open circuit conditions. t1 Figure D-7: CI 220 Pulse F1 Characteristics Pulse F1 - Parameters Up 13.5 V Us 37 V tr 10 (-0.5 / +0) us td 50 us t1 0.
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EMC-CS-2009.1 Figure D-8: CI 220 Pulse F2 Pulse Characteristics V Pulse F2 - Parameters Up 13.5 V Us 10 V tr 1 ± 0.5 ms tf 1 ± 0.5 ms t6 1 ± 0.5 ms td 0.2 – 2 s Ri < 0.5 ohms tf UP 0.9UP US Parameters listed are for open circuit conditions. D.3 0.1UP Test Pulses G1 and G2 Pulse G1 represents the transient produced due to sudden disconnection of the battery from the alternator. The test pulse is equivalent to Test Pulse 5a delineated in ISO 7637-2 (2004-06-15).
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EMC-CS-2009.1 Figure D-10: CI 220 Pulse G2 Characteristics Pulse G2 Parameters Up 13.5 V Us 30 V Us * V 21.5 (-1/+0) V tr 10 ( -5 /+0 ) ms td 150 mS +/-20% Ri 0.5 Ohms All voltage values are with respect to 0 volts unless otherwise specified. Voltage values listed are across a 0.5 ohm resistive load (see section 16.3).
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EMC-CS-2009.1 D.4 Transient Application Mode Application of transient pulses A1, A2 and C to the DUT are facilitated using three different operating modes. Mode 1 represents a condition where the test pulse is applied at a fixed repetition rate as shown in Table D-1 below. Mode 1 is applicable for pulses A1 and A2 only when applied to DUT switched power supply circuits. Table D-1: CI 220 Mode 1 Characteristics Transient Pulse A1 A2-1 Pulse Repetition Rate (PRR) Duration 0.
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EMC-CS-2009.
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EMC-CS-2009.1 Annex E (Normative): Transient Waveform Application Applications of Test pulses A, C, E and G are largely dependent on how the DUT is connected to the power distribution system. This annex provides basic information with respect to application for each transient test pulse.
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EMC-CS-2009.1 Configuration 3 DUT power circuit "A" shares same circuit as inductive load when SW2 is closed. The DUT and inductive load are switched via ignition switch or ignition relay. Transient pulses A1, A2 and E will be present at "A" if SW2 remains closed and IGN SW opens. Transient pulse C will be present at "A" if IGN SW remains closed and SW2 opens or bounces. Pulse C and G (load dump) will be present at "A" when IGN SW is closed.
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EMC-CS-2009.1 Annex F (Normative): Transient Test Generator The test generator presented in this annex produces transients for the following test methods: • RI 130 • CI 220 Pulses A1, A2, and C Figure F-1 illustrates the transient generator circuit that will produce CI 220 transient pulses A1, A2, and C in Modes 1, 2 and 3. The circuit contains a few critical components that may not be substituted without permission from the FMC EMC department. These components are highlighted in the figures.
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EMC-CS-2009.
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EMC-CS-2009.1 Table F-2: CI 220 Transient Generator ( P&B Relay Specifications ) Contact Arrangement: 3 Form C, 3PDT, 3 C/O Contact Current Rating (Amps.): 10 Coil Magnetic System: Mono-stable Coil Selection Criteria: Nominal Voltage Actuating System: AC Input Voltage (VAC): 12 Coil Suppression Diode: Without Coil Resistance (Ω): 18 Coil Power, Nominal (VA): 2.70 Mounting Options: Plain Case Termination Type: .187 x .
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EMC-CS-2009.1 Annex G (Normative): Load Simulator Requirements The Load Simulator is a shielded enclosure that contains all external electrical interfaces (sensors, loads etc.) normally connected to the DUT. The Load Simulator also serves as an RF boundary for the DUT cable harness in addition to serving as an interface to support and monitoring equipment required during testing. A typical Load Simulator is illustrated in Figure G-1.
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EMC-CS-2009.1 Figure G-1: Load Simulator (Typical Design) Load Simulator Power (+) + From DUT Support Equipment C - C + - C + To DUT Monitoring Equipment C C - C To CAN Support CAN or LIN Termination C* C* 5VDC REG C C = 10 nF Value is mandatory for all Load Simulator applications unless otherwise specified in product EMC specification. Deviation requires approval by FMC EMC department and noted in EMC test plan..
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EMC-CS-2009.1 Figure G-2: Load Simulator CAN Interface Circuit Design Requirements CAN HIGH Z 60Ω 4.7nF 60Ω Z CAN LOW Configuration A Devices with internal CAN Termination CAN HIGH 60Ω 60Ω 4.7nF 60Ω Z 4.
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EMC-CS-2009.1 Figure G-3: Load Simulator Test setup AN AN 2 + + _ C - C + - C C < 150mm + FO C - S C S CAN Termination CAN FO FO C* C* CAN FO M To DUT 5VDC REG C M 1 Key 1. 2.
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EMC-CS-2009.1 Annex H (Normative): RI 130, RI 150 Test Fixture and Application The test fixture used for RI 130 and RI 150 is illustrated in Figure H-1. The fixture consists of a wire support fixture mounted to an aluminum plate. The wire support fixture is constructed from Delrin® 570 NC000. Detailed constructions plans for this fixture may be found at www.fordemc.com. Figure H-1: RI 130/150 Test Fixture (Top View) 4 Side View 3 1 2 3 All Dimensions in mm Top View Without Lid 1000 ± 0.
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EMC-CS-2009.1 If the DUT contains circuit loads that have a dedicated signal return back to the DUT (a signal return not shared by any other circuit load), each wire of the circuit pair shall be placed in the separate slots (Slots A and B) located in the test fixture as illustrated in Figure H-3. Dedicated signal returns shall always be located in Slot B unless specified in the EMC test plan.
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EMC-CS-2009.1 Annex I (Normative): Method for Determining Correction Factor for CE 421 CE 421 requires voltage measurements similar to that required for CE 420, but at frequencies below that specified in CISPR 25. In order make these measurements, a correction factor (CF) must be applied. Although this correction factor accounts for the insertion loss between the Artificial Network's DUT and measurement ports, it is not the same as insertion loss (e.g.
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EMC-CS-2009.1 Figure I-1: CE 421 Test Setup using Standard CISPR 25 Artificial Network A P 5 uH 0.1 uF 4 2 1 uF C 3 1 000 Ω B B 1 Figure I-2: CI 421 Setup for Measurement of POUT < 1000 mm A P 1 5 7 6 B 9 8 C B Figure I-3 CI 421 Setup for Measurement of PIN < 1000 mm A P 7 9 1 5 B 6 B 8 C Key: 1. Artificial Network (per CISPR 25) 6. 50 ohm Coaxial equivalent) 2. DUT 7. 50 ohm Signal Generator 3. Measurement Receiver 8. 50 ohm Measurement Receiver 4. Power Supply 9.