Datasheet

QTD20.241
Q-Series
24V, 20A, DC INPUT
Mar 2012 / Rev. 1.2 DS-QTD20.241-EN
All parameters are specified at 24V, 20A, 600Vdc input, 25°C ambient and after a 5 minutes run-in time unless otherwise noted.
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13. TERMINALS AND WIRING
Type Bi-stable, quick-connect spring clamp terminals. IP20 Finger safe construction.
Suitable for field- and factory installation. Shipped in open position.
Solid wire 0.5-6mm
2
Stranded wire 0.5-4mm
2
American wire gauge 20-10 AWG
Ferrules Allowed, but not required
Wire stripping length 10mm / 0.4inch
Pull-out force 10AWG:80N, 12AWG:60N, 14AWG:50N, 16AWG:40N (according to UL486E)
Fig. 13-1 Connecting a wire
1. Insert the wire 2. Close the lever
To disconnect wire:
reverse the procedure
Instructions:
a) Use appropriate copper cables that are designed
for an operating temperature of:
Input: 60°C for ambient up to 45°C and
75°C for ambient up to 60°C minimum.
Output: 75°C for ambient up to 40°C and
95°C for ambient up to 60°C minimum.
b) Follow local and national installation codes and
installation regulations!
c) Ensure that all strands of a stranded wire enter
the terminal connection!
d) Up to two stranded wires with the same cross
section are permitted in one connection point
(except PE wire).
e) Do not use the unit without PE connection.
14. RELIABILITY
600Vdc
Lifetime expectancy min. 42 000h 40°C, 24V, 20A
min. 77 500h 40°C, 24V, 10A
min. 119 000h 25°C, 24V, 20A
MTBF SN 29500, IEC 61709 446 000h 40°C, 24V, 20A
801 000h 25°C, 24V, 20A
MTBF MIL HDBK 217F 204 000h 40°C, 24V, 20A, Ground Benign GB40
267 000h 25°C, 24V, 20A, Ground Benign GB25
The Lifetime expectancy shown in the table above indicates the operating hours (service life) and is determined by
the lifetime expectancy of the built-in electrolytic capacitors.
Lifetime expectancy is specified in operational hours and is calculated according to the capacitor’s manufacturer
specification. The prediction model allows a calculation of up to 15 years from date of shipment.
MTBF stands for Mean Time Between Failure, which is calculated according to statistical device failures, and indicates
reliability of a device. It is the statistical representation of the likelihood of a unit to fail and does not necessarily
represent the life of a product.
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