Summary
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-To qualify GaN on Si devices it is insufficient to follow standard Silicon
qualification matrix
-5 required elements to a qualification are described: the qual matrix is
only 1 component
-Establishing GaN device performance to all 5 elements will assure reliable
operation to a specified application
-Preliminary GaN device reliability data is provided to illustrate the
elements
-A full qualification will include fully addressing all 5 dimensions
In a single phrase:
To qualify GaN on Silicon it is not sufficient to
follow the existing “JEDEC Std” Qualification
Matrix; a comprehensive 5 element methodology
is proposed that will assure reliable operation to
a given application profile