Sample Silicon Qualification Test Plan
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Accelerated Environment Stress Tests
REQUIRED RELIABILITY TESTS
Parameter
Part Type
Test
Conditions
Duration
measurements @
Quantity
Part no “X”
TC
-55°C/150°C
1000 cy
0/168/500/1000
3 x 77
H
3
TRB
85°C/85%RH/100V
1000 hrs
0/168/500/1000
3 x 77
HTRB
150°C/960V
1000 hrs
0/168/500/1000
3 x 77
HTGB
150°C/20V
1000 hrs
0/168/500/1000
3 x 77
IOL
delta Tj = 100°C
5,000 cy
0/2500/5000
3 x 77
AC
121°C/15psig
96 hrs
0/96
3 x 77
/480V
With knowledge of Failure mechanisms and appropriate modeling
and with detailed application and qualification requirements
profiles the test conditions of the qualification can be chosen to
assure required useful life is met.