Qualification Test Plan
22 Copyright © Infineon Technologies AG 2013. All rights reserved.
The testplan includes:
- Definition of sample size in respect to internal and common standards
like JEDEC, Q101, etc.
- All tests and test parameters to address all known degradation modes.
- All tests with critical reliability impact seen during the development
phase testing where the test parameters reflect the outcome of the
degradation and acceleration models.
- All tests and test conditions required in the international norms
- The results of the tests will be judged and as “pass” or “fail” label
displayed in the list.
Criterias are given within the QRP and data sheet limits
In a single phrase:
The qualification test plan summarizes all
relevant reliability tests to assure
that the required lifetime and failure rate limits
are fulfilled.