Preliminary Reverse Bias Lifetime Estimate
for early HV GaN Devices
1E-1
1E+0
1E+1
1E+2
1E+3
1E+4
1E+5
1E+6
1E+7
1E+8
1E+9
1E+10
1E+11
300 350 400 450 500 550 600 650 700 750 800 850 900
MTTF [Hrs]
Stress Voltage [V]
25C
-Use accelerated data to set test
conditions for 1,000 hr testing (ie: to
generate a meaningful Qualification Test
Plan)
-Use statistics to calculate FIT rate at
required lifetime and use conditions
Engineering Evaluation of Early Samples