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Presentation GaN APEC 2015 GaN Reliability 01_00 Manuals
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Mar 18, 2015
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Time Dependent
Dielectric Breakdown
Related
Reliability
Prokopowicz and
V
askas Equation
Acceler
ated Stress Conditions
Michael S. R
andall et
al (KEMET), Proceedings of CAR
TS 2003 pp. 1-7
Cer
amic Capacitors :
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