Example Element of Quality Requirement
Temp. Profile Conversion
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The different temperatures are corresponding to varying levels of output power and
ambient temperatures over the application lifetime.
The electrical biased tests has to consider this thermal profile.
Using acceleration models the application profile can be converted to useful stress
conditions.
Time /h Temp. /°C
3504 30
28032 50
35040 70
3504 105
S = 70080
(~8a)
Temp. Profile of Application
Time /h Temp. /°C
70080 67.5
Time /h Temp. /°C
1181 175
Converted Temp. Profile
to Mean Temp. over Lifetime
Profile conversion with
temp. accel. model to
equivalent temp. profile
Mean Temp. over Lifetime
Converted to Accelerated
Stress Condition
≙
≙
This example assumes Silicon device with Activation
Energy of 0.5 eV