Data Sheet

FinalDatasheet 8 Rev.1.0, 2008-09-18
TLE4946-2K
Specification
3 Specification
3.1 Absolute Maximum Ratings
Table 2 Absolute Maximum Ratings
Parameter Symbol Values Unit Note/Test Condition
Min. Typ. Max.
Max. junction temperature T
J
-40 – 150 °C
– – 155 for 2000 h (not additive)
– – 165 for 1000 h (not additive)
– – 175 for 168 h (not additive)
– – 195 for 3 x 1 h (additive)
Supply voltage V
DD
-18
-18
-18
–
–
–
18
24
26
V
for 1h, R
s
≥ 200Ω
for 5min, R
s
≥ 200Ω
Supply current through
protection device
I
S
– 50 – + 50 mA
Output voltage V
Q
-0.7 – 18 V
-0.7 – 26 for 5min @ 1.2kΩ pull
up
Storage temperature T
S
– 40 – 150 °C
Magnetic flux density B – unlimited mT
ESD robustness
HBM: 1.5 kΩ, 100 pF
V
ESD,HBM
4 kV According to
EIA/JESD22-A114-B
Attention: Stresses above the max. values listed here may cause permanent damage to the device.
Exposure to absolute maximum rating conditions for extended periods may affect device
reliability. Maximum ratings are absolute ratings; exceeding only one of these values may
cause irreversible damage to the integrated circuit.