Datasheet

Multilayer Ceramic Capacitors(2 Array Type)
n Temperature Characteristics
n Rated Voltage
n Nominal Capacitance
n Capacitance tolerance
n Specifications and Test Method
*Standard condition : Temperature 15 to 35 ûC, Relative humidity 45 to 75 %
Soldering method for multilayer ceramic chip capacitor array shall be reflow soldering.
Flow soldering prohibited because solder bridge causes short circuit between terminal electrodes.
Code Temp. Char. Capacitance Change Measurement Temperature Range Reference Temperature
B ±10 % Ð25 to 85 ûC 20 ûC
B X7R ±15 % Ð55 to 125 ûC 25 ûC
X5R ±15 % Ð55 to 85 ûC 25 ûC
Code 1H 1E 1C 1A 0J
Rated Voltage
DC 50 V DC 25 V DC 16 V DC 10 V DC 6.3 V
Class Temp. Char. Tolerance Code Capacitance Tolerance
1CH
F C=10 pF ±1 pF
KC>15 pF ±10 %
2 B, X7R, X5R M ±20 %
Ex. 100 101 103 104 105
Nominal
10 pF 100 pF
10,000 pF 100,000 pF 1,000,000 pF
Capacitance (0.01 µF) (0.1 µF) (1.0 µF)
Code Temp. Char. Temperature. Coefficient.
C CH 0±60 ppm/¡C
l Class 1
l Class 2
Item Specifications Test Method
Operating Temperature Range CH: B, X7R:Ð55 to 125 ¡C
ÑÑ
Ð55 to 125 ¡C X5R:Ð55 to 85 ¡C
Dielectric No break down
Withstanding Voltage
Insulation
10000 MW or 500/C (MW) Whichever is less
Measuring voltage:Rated voltage
Resistance (IR)
(C: Nominal Cap. in µF) Duration: 60 ± 5 s
Chage/discharge current: Within 50 mA
Capacitance Within the specified tolerance
Q Factor or
tan d :
Dissipation Factor B, X7R:0.025 max.
(tan d) X5R:0.15 max.
Test voltage:
Class 1: Rated voltage ´300%
Class 2: Rated voltage ´250%
Duration: 1 to 5 s
Charge/discharge current: Within 50 mA
C < 30 pF: Q > 400+20 C
30 pF < C < 1000 pF: Q > 1000
(C:Nominal Cap. in pF)
Reference temperature:20 ± 2 ûC
Class 1
Measuring frequency :1 MHz ± 10%
Measuring voltage :0.5 to 5 Vrms
Class 2
Pretreatment : The capacitors shall be
kept in a temperature of150+0/-10ûC
for 1 hour and then shall be stored in
standard condition
*
for 48 ± 4 hours,
before initial measurement.
Measuring frequency :1kHz ± 10%
Measuring voltage :1.0 ± 0.2Vrms