Datasheet

6 of 7
Aug 28, 2008
CLASSIFICATION
SPECIFICATION
No.
SUBJECT
PAGE
DATE
151S-ECJ-KGS45E
Multilayer Ceramic Chip Capacitors (EIA 1206)
Low Profile type (P/N : ECJHVB1C475K) Common Specification
Note ;
Table 2
No
Contents Performance Test Method
Appear-
ance
There shall be no cracks and other
mechanical damage.
Temp .
Char.
Change from the value be-
fore test.
Capaci-
tance
X5R Within +/- 12.5 %
tan δ
0.15 max.
16 High Tem-
perature Re-
sistant
Loading
I.R.
50/C MΩ min.
(C : Nominal Cap. in µF)
For the class2 capacitors, perform the volt-
age
treatment in par. 5-1-2.
Solder the specimen to the testing jig shown
in Fig. 2.
Test temperature :
Max. Rated temp. +/-3°C
Applied voltage : 200% of Rated voltage
(DC Voltage)
Charge/discharge current : within 50 mA.
Test period : 1000+48/0 h
Before the measurement after test, the spe-
cimen shall be left to stand at room tempera-
ture for the following period : 48+/-4 h
When uncertainty occurs in the weather resistance characteristic tests (temperature cycle, moisture resistance,
moisture resistant loading, high temperature resistant loading), the same tests shall be performed for the capacitor itself.
Table 3
Our Standard Measuring Instrument
Measuring Instrument 4278A 1kHz/1MHz Capacitance Meter (Agilent Technologies)
Measuring Mode Parallel Mode
Recommended
Measuring Jig
16034E Test Fixture (Agilent Technologies)
For High Cap Type, signal voltage may be unable to be applied to depending on conditions of measuring instruments.
We would appreciate it if you would confirm whether High Cap Type is under the measurable environment or not by
checking that the fixed signal voltage is applied or not. (For example, ALC function is ON, HPA is expanded.)