Datasheet

5 of 7
Aug 28, 2008
CLASSIFICATION
SPECIFICATION
No.
SUBJECT
PAGE
DATE
151S-ECJ-KGS45E
Multilayer Ceramic Chip Capacitors (EIA 1206)
Low Profile type (P/N : ECJHVB1C475K) Common Specification
Note ;
Table 2
No
Contents Performance Test Method
Appear-
ance
There shall be no cracks and other
mechanical damage.
Temp .
Char.
Change from the value
before test.
Capaci-
tance
X5R Within +/- 7.5 %
tan δ
Shall meet the specified initial value.
I.R. Shall meet the specified initial value.
13 Temperature
cycle
With-
stand
voltage
There shall be no dielectric break-
down or damage.
Solder the specimen to the testing jig shown
in Fig. 2. Condition the specimen to each
temperature from step 1 to 4 in this order for
the period shown in the table below. Regard-
ing this conditioning as one cycle, perform
5 cycles continuously.
For the class2 capacitors, perform the heat
treatment in par. 5-1-1.
Before the measurement after test, the
specimen shall be left to stand at room
temperature for the following period :
48+/-4 h
Appear-
ance
There shall be no cracks and other
mechanical damage.
Temp .
Char.
Change from the value
before test.
Capaci-
tance
X5R Within +/- 12.5 %
tan δ
0.15 max.
14 Moisture
Resistance
I.R.
50/C MΩ min.
(C : Nominal Cap. in µF)
For the class2 capacitors, perform the heat
treatment in par. 5-1-1.
Solder the specimen to the testing jig shown
in Fig. 2.
Test temperature : 40+/-2 °C
Relative humidity : 90 to 95 %
Test period : 500+24/0 h
Before the measurement after test, the spe-
cimen shall be left to stand at room tempera-
ture for the following period :
48+/-4 h
Appear-
ance
There shall be no cracks and other
Mechanical damage.
Temp .
Char.
Change from the value
before test.
Capaci-
tance
X5R Within +/- 12.5 %
tan δ
0.15 max.
15 Moisture
Resistant
Loading
I.R.
25/C MΩ min.
(C : Nominal Cap. in µF)
For the class2 capacitors, perform the heat
treatment in par. 5-1-2.
Solder the specimen to the testing jig shown
in Fig. 2.
Test temperature : 40+/-2 °C
Relative humidity : 90 to 95 %
Applied voltage : Rated voltage
(DC Voltage)
Charge/discharge current : within 50 mA.
Test period : 500+24/0 h
Before the measurement after test, the spe-
cimen shall be left to stand at room tempera-
ture for the following period :
48+/-4 h
(continue)
Step
Temperature
(°C)
Period
(min.)
1
Minimum operation
temperature +/- 3
30+/-3
2 Room temperature 3 max.
3
Maximum operation
temperature +/-5
30+/-3
4 Room temperature 3 max.