Datasheet

3 of 7
Aug 28, 2008
CLASSIFICATION
SPECIFICATION
No.
SUBJECT
PAGE
DATE
151S-ECJ-KGS45E
Multilayer Ceramic Chip Capacitors (EIA 1206)
Low Profile type (P/N : ECJHVB1C475K) Common Specification
Note ;
Table 2
No
Contents Performance Test Method
1 Appearance There shall be no defects which affect
the life and use.
With a magnifying glass (3 times).
2 Dimensions Shown in Individual Specification. With slide calipers and a micrometer.
3 Dielectric Withstand-
ing voltage
There shall be no dielectric break-
down or damage.
Test voltage : 250 % of rated voltage
Apply a DC voltage of the above value for 1 to
5 seconds.
Charge/discharge current shall be within
50mA.
4
Insulation
Resistance(I.R.)
500/C MΩ min.
(C : Nominal Cap. in µF)
Measuring voltage : Rated voltage
Measuring voltage time : 60+/-5s
Charge/discharge current shall be within
50mA.
5 Capacitance Shall be within the specified tolerance.
6 Dissipation Factor
(tan δ)
0.1 max.
For the class2 Capacitors, perform the heat
treatment in par. 5-1-1.
Our Measurement instrument is shown in the
Table 3.
7 Temperature
Coefficient
Without
Voltage
Appli-
cation
Temp. Char.
X5R : Within +/- 15 %
Measure the capacitance at each stage by
changing the temperature in the order of step 1
to 4 shown in the table below. Calculate the
rate of change regarding the capacitance at
stage 3 as the reference.
8 Adhesion The terminal electrode shall be free
from peeling or signs of peeling.
Solder the specimen to the testing jig shown in
the figure., and apply a 5N force in the arrow
direction for 10 seconds.
Material : Alumina board (95% min.) or glass
epoxy board.
Thickness : 1.0mm min.
(continue)
Measuring
Frequency
Measuring
Voltage
1 kHz+/-10 % 1.0+/-0.2 Vrms
(Unit : °C)
Stage
1 2 3 4 5
X5R 25+/-2 -55+/-3 25+/-2 85+/-2 25+/-2
Temp .
Char.
Measuring
Frequency
Measuring
Voltage
1 kHz+/-10 % 1.0+/-0.2 Vrms