Datasheet

2 of 7
Aug 28, 2008
CLASSIFICATION
SPECIFICATION
No.
SUBJECT
PAGE
DATE
151S-ECJ-KGS45E
Multilayer Ceramic Chip Capacitors (EIA 1206)
Low Profile type (P/N : ECJHVB1C475K) Common Specification
Note ;
3- 3.Nominal Capacitance (6)
The Nominal Capacitance value is expressed in pico farads(pF) and
is identified by a three-digit number ; the first two digit
represent significant figures and the last digit specifies the number of
zero to follow.
4. Operating Temperature Range
Shown in Individual Specification.
5. Performance
The performance of the capacitor and its test condition shall be specified in Table 2.
5- 1.Pretreatment
Before test and measurements, the following pretreatment shall be applied when necessary.
5-1-1. Heat Treatment
The capacitors shall be kept in a temperature of 150+0/-10°C for 1 hour and then shall be stored in a room tem-
perature for 48±4 hours, before initial measurement.
5-1-2. Voltage Treatment
D.C. voltage shall be applied for 1 hour in the specified test condition and then shall be stored in a room tempera-
ture for 48 +/- 4 hours, before initial measurement.
6. Test
Unless otherwise specified, all test and measurements shall be made at a temperature of 15 to 35°C and at a relative
humidity of 45 to 75%.
If results obtained are doubted a further test should be carried out at a temperature of 20±2℃ and a relative humidity
of 60 to 70%.
7. Structure
The structure shall be in a monolithic form as shown in Fig. 1.
Fig. 1 Table 1
No. Name
①
Dielectric
②
Inner electrode
③
Substrate electrode
④
Intermediate electrode
⑤
External electrode
.
Symbol (Ex.) Nominal Cap.
105 1000000pF
(1 µF)
475 4700000pF
(4.7 µF)
106 10000000pF
(10 µF)