Datasheet
LM317L, NCV317LB
http://onsemi.com
3
ELECTRICAL CHARACTERISTICS (V
I
-V
O
= 5.0 V; I
O
= 40 mA; T
J
= T
low
to T
high
(Note 3); I
max
and P
max
(Note 4);
unless otherwise noted.)
LM317L, LB, NCV317LB
Characteristics Figure Symbol Min Typ Max Unit
Line Regulation (Note 5)
T
A
= 25°C, 3.0 V ≤ V
I
- V
O
≤ 40 V
1 Reg
line
- 0.01 0.04 %/V
Load Regulation (Note 5), T
A
= 25°C
10 mA ≤ I
O
≤ I
max
- LM317L
V
O
≤ 5.0 V
V
O
≥ 5.0 V
2 Reg
load
-
-
5.0
0.1
25
0.5
mV
% V
O
Adjustment Pin Current 3 I
Adj
- 50 100
mA
Adjustment Pin Current Change
2.5 V ≤ V
I
- V
O
≤ 40 V, P
D
≤ P
max
10 mA ≤ I
O
≤ I
max
- LM317L
1, 2
DI
Adj
- 0.2 5.0
mA
Reference Voltage
3.0 V ≤ V
I
- V
O
≤ 40 V, P
D
≤ P
max
10 mA ≤ I
O
≤ I
max
- LM317L
3 V
ref
1.20 1.25 1.30 V
Line Regulation (Note 5), 3.0 V ≤ V
I
- V
O
≤ 40 V 1 Reg
line
- 0.02 0.07 %/V
Load Regulation (Note 5)
10 mA ≤ I
O
≤ I
max
- LM317L
V
O
≤ 5.0 V
V
O
≥ 5.0 V
2 Reg
load
-
-
20
0.3
70
1.5
mV
% V
O
Temperature Stability (T
low
≤ T
J
≤ T
high
) 3 T
S
- 0.7 - % V
O
Minimum Load Current to Maintain Regulation (V
I
- V
O
= 40 V) 3 I
Lmin
- 3.5 10 mA
Maximum Output Current
V
I
- V
O
≤ 6.25 V, P
D
≤ P
max
, Z Package
V
I
- V
O
≤ 40 V, P
D
≤ P
max
, T
A
= 25°C, Z Package
3 I
max
100
-
200
20
-
-
mA
RMS Noise, % of V
O
T
A
= 25°C, 10 Hz ≤ f ≤ 10 kHz
- N - 0.003 - % V
O
Ripple Rejection (Note 6)
V
O
= 1.2 V, f = 120 Hz
C
Adj
= 10 mF, V
O
= 10.0 V
4 RR
60
-
80
80
-
-
dB
Thermal Shutdown (Note 7) - - - 180 - °C
Long Term Stability, T
J
= T
high
(Note 8)
T
A
= 25°C for Endpoint Measurements
3 S - 0.3 1.0 %/1.0 k
Hrs.
3. T
low
to T
high
= 0° to +125°C for LM317L -40° to +125°C for LM317LB, NCV317LB
4. I
max
= 100 mAP
max
= 625 mW
5. Load and line regulation are specified at constant junction temperature. Changes in V
O
due to heating effects must be taken into account
separately. Pulse testing with low duty cycle is used.
6. C
Adj
, when used, is connected between the adjustment pin and ground.
7. Thermal characteristics are not subject to production test.
8. Since Long-Term Stability cannot be measured on each device before shipment, this specification is an engineering estimate of average
stability from lot to lot.
