Data Sheet

©2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
6N138, 5N139, NCPL2730, HCPL2731 Rev. 1.0.5 11
Single-Channel: 6N138, 6N139 Dual-Channel: HCPL2730, HCPL2731 — Low Input Current High Gain Split Darlington Optocouplers
Test Circuits
Pulse Gen
CM
V
V
FF
B
A
+-
+5 V
O
V
-
I
F
3
4
F
V
2
1
Shield
Noise
6
O
5
GND
7
8
V
B
V
CC
V
L
R
PLH
OL
V
V
O
5 V
1.5 V
F
I
1.5 V
T
PHL
T
Switch at A : I = 0 mA
F
Switch at B : I = 1.6 mA
F
t
r
V
O
O
V
OL
V
5 V
0 V
10% 10%
90%
CM
V 10 V
4 5
Noise
1
2
3
Shield
8
7
6
+5 V
O
V
VCC
V01
V02
GND
V
F1
-
+
F2V
FI
+
10% DUTY CYCLE
I/f < 100 µS
FI
MONITOR
LR
0.1 µF
Pulse
Generator
tr = 5ns
Z = 50V
O
GND
+
-
F2V
V
F1
-
+5 V
CCV
L
V02
V
R
01
V
O
V
CM
A
B
Pulse Gen
F
I
+-
+
3
I Monitor
F
4
I/ < 100ns
10% D.C.
tr = 5ns
Generator
Pulse
Z = 50
f
O
V
F
I
V
F
2
1
V
O
O
6
5
GND
7
8
V
B
V
L
R
CC
V
+5 V
0.1 µF
LC = 15 pF*
Test Circuit for 6N138, 6N139
0.1 µF
Test Circuit for HCPL2730 and HCPL2731
Test Circuit for 6N138 and 6N139 Test Circuit for HCPL2730 and HCPL2731
f
t
FF
V
m
R
Rm
90%
1
3
4
2
Shield
Noise
8
6
5
7
Shield
Noise
-
C = 15 pF*L
0.1 µF
Fig. 24 Switching Time Test Circuit
Fig. 25 Common Mode Immunity Test Circuit