Data Sheet

©2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7 8
Single-Channel: 6N135, 6N136 , HCPL2503, HCPL4502 Dual-Channel: HCPL2530, HCPL2531 — High Speed Transistor Optocouplers
Test Circuits
Pulse Gen
CM
V
V
FF
B
A
+-
+5 V
O
V
-
I
F
3
4
+
F
V
-
2
1
Shield
Noise
6
O
5
GND
7
8
V
B
V
CC
V
L
R
PLH
OL
V
V
O
0
5 V
1.5 V
F
I
1.5 V
T
PHL
T
Switch at A : I = 0 mA
F
Switch at A : I = 16 mA
F
t
r
V
O
O
V
OL
V
5 V
0 V
10% 10%
90%
CM
V 10 V
4 5
Noise
1
2
3
Shield
8
7
6
+5 V
O
V
V CC
V 01
V 02
GND
V
F1
-
+
F2 V
-
F I
+
10% DUTY CYCLE
I/f < 100µS
F I
MONITOR
L R
C = 1.5 µF
L
Pulse
Generator
tr = 5ns
Z = 50
O
Ω
GND
+
4 5
1
3
2
-
F2 V
V
F1
-
Shield
Noise
+5 V
CC
8
V
L
V
6
02
V
7
R
01
V
O
V
CM
A
B
Pulse Gen
F
I
+-
+
3
I Monitor
F
4
I/f < 100µs
10% D.C.
tr = 5ns
Generator
Pulse
Z = 50
O
+
V
F
I
Ω
F
-
2
1
Shield
Noise
V
O
O
6
5
GND
7
8
V
B
V
L
R
CC
V
+5 V
0.1 µF
L C = 1.5 µF
Test Circuit for 6N135, 6N136, HCPL-2503 and HCPL- 4502
0.1 µF
Test Circuit for HCPL-2530 and HCPL-2531
Test Circuit for 6N135, 6N136, HCPL-2503 and HCPL-4502 Test Circuit for HCPL-2530 and HCPL-2531
f
t
0.1 µF
0.1 µF
FF
V
m
R
m
R
90%
Fig. 7 Switching Time Test Circuit
Fig. 8 Common Mode Immunity Test Circuit