Data Sheet

© Semiconductor Components Industries, LLC, 2010 www.onsemi.com
FOD8316 Rev. 2 18
FOD8316 — 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection and Isolated Fault Sensing
Test Circuits (Continued)
Fi
gure 44. Reset Delay (t
RESET
(FAULT)
)
Test Circuit
Figure 45. Under Voltage Lockout Delay (t
UVLO
) and Time to Good Power (t
GP
) Test Circuit
FOD8316
0.1 µF
0.1 µF
0.1 µF
5 V
+
–
+
–
+
–
1
2
3
4
5
6
7
8
V
IN+
V
IN–
V
DD1
GND1
RESET
FAULT
V
LED1+
V
LED1-
*
V
E
V
LED2+
DESAT
V
DD2
V
S
V
O
V
SS
V
SS
16
15
14
13
12
11
10
9
FOD8316
V
E
V
O
0.1 µF
0.1 µF
100 pF
10 nF
0.1 µF
RL
5 V
30 V
+
–
+
–
+
–
Low to High
+
–
FOD8316
0.1 µF
0.1 µF
10 nF
0.1 µF
RL
5 V
30 V
+
–
+
–
+
–
Strobe 8 V
V
FAULT
+
–
Figure 43. DESAT Sense (t
DESAT(90%)
, t
DESAT(10%)
), DESAT Fault (t
DESAT(FAULT)
), and (t
DESAT(LOW)
) T
est Circuit
3 kΩ
3 kΩ
3 kΩ
FOD8316
0.1 µF
0.1 µF
0.1 µF
5 V
+
–
+
–
+
–
FOD8316
0.1 µ
F
0.1 µF
100 pF
10 nF
0.1 µ
F
RL
5 V
30 V
+
–
+
–
+
–
Low to High
+
–
1
2
3
4
5
6
7
8
V
IN+
V
IN–
V
DD1
GND1
RESET
FAULT
V
LED1+
V
LED1-
*
V
E
V
LED2+
DESAT
V
DD2
V
S
V
O
V
SS
V
SS
16
15
14
13
12
11
10
9
FOD8316
V
E
V
O
0.1 µF
0.1 µF
10 nF
0.1 µF
RL
5 V
30 V
+
–
+
–
+
–
V
FAULT
Strobe 8 V
+
–
3 kΩ
3 kΩ
3 kΩ
1
2
3
4
5
6
7
8
V
IN+
V
IN–
V
DD1
GND1
RESET
FAULT
V
LED1+
V
LED1-
*
V
E
V
LED2+
DESAT
V
DD2
V
S
V
O
V
SS
V
SS
16
15
14
13
12
11
10
9
FOD8316
V
E
V
O
V
DD2
**
**1.0 ms ramp for t
UVLO
10 µs ramp for t
GP
0.1 µF
0.1 µF
0.1 µF
5 V
+
–
+
–
+
–
FOD8316
0.1 µF
0.1 µF
100 pF
10 nF
0.1 µ
F
RL
5 V
30 V
+
–
+
–
+
–
Low to High
+
–
FOD8316
0.1 µF
0.1 µF
10 nF
0.1 µ
F
RL
5 V
30 V
+
–
+
–
+
–
Strobe 8 V
+
–
3 k
Ω
3 kΩ
3 kΩ