Data Sheet

© Semiconductor Components Industries, LLC, 2010 www.onsemi.com
FOD8316 Rev. 2 16
FOD8316 — 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection and Isolated Fault Sensing
Test Circuits (Continued)
Figure 37. High Level (V
OH
) and Low Level (V
OL
) Output Voltage Test Circuit
Fi
gure 38. High Level (I
DD1H
) and Low Level (I
DD1L
) Supply Current Test Circuit
Fi
gure 39. High Level (I
DD2H
), Low Level (I
DD2L
) Output Supply Current,
Hi
gh Level (I
SH
), Low Level (I
SL
) Source Current,
V
E
High Level (I
EH
), and V
E
Low Level (I
EL
) Supply Current Test Circuit
1
2
3
4
5
6
7
8
V
IN+
V
IN–
V
DD1
GND1
RESET
FAULT
V
LED1+
V
LED1-
*
V
E
V
LED2+
DESAT
V
DD2
V
S
V
O
V
SS
V
SS
16
15
14
13
12
11
10
9
FOD8316
V
E
V
O
Switch A for V
OH
test
Switch B for V
OL
test
0.1 µF
A
A
B
B
0.1 µF
0.1 µF
100 mA
pulsed
100 mA
pulsed
3 kΩ
5 V
30 V
+
–
+
–
+
–
FOD8316
0.1 µF
5 V
+
–
FOD8316
0.1 µ
F
0.1 µF
0.1 µF
5 V
30 V
+
–
+
–
+
–
A
B
A
B
FOD8316
Switch A for I
DD1H
test
Switch B for I
DD1L
test
0.1 µ
F
A
A
B
B
0.1 µ
F
0.1 µ
F
100 mA
pulsed
100 mA
pulsed
3 kΩ
5 V
30 V
+
–
+
–
+
–
1
2
3
4
5
6
7
8
V
IN+
V
IN–
V
DD1
GND1
RESET
FAULT
V
LED1+
V
LED1-
*
V
E
V
LED2+
DESAT
V
DD2
V
S
V
O
V
SS
V
SS
16
15
14
13
12
11
10
9
FOD8316
I
DD1
0.1 µF
5 V
+
–
FOD8316
0.1 µF
0.1 µF
0.1 µF
5 V
30 V
+
–
+
–
+
–
A
B
A
B
FOD8316
Switch A for I
DD2H,
I
SH
and I
EH
test
Switch B for I
DD2L,
I
SL
and I
EL
test
0.1 µ
F
A
A
B
B
0.1 µF
0.1 µF
100 mA
pulsed
100 mA
pulsed
3 kΩ
5 V
30
V
+
–
+
–
+
–
FOD8316
0.1
µF
5 V
+
–
I
DD2
I
S
I
E
1
2
3
4
5
6
7
8
V
IN+
V
IN–
V
DD1
GND1
RESET
FAULT
V
LED1+
V
LED1-
*
V
E
V
LED2+
DESAT
V
DD2
V
S
V
O
V
SS
V
SS
16
15
14
13
12
11
10
9
FOD8316
V
E
V
O
0.1 µF
0.1 µF
0.1 µF
5 V
30 V
+
–
+
–
+
–
A
B
A
B