Data Sheet

©2004 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD420, FOD4208, FOD4216, FOD4218 Rev. 1.6 5
FOD420, FOD4208, FOD4216, FOD4218 — 6-Pin DIP High dv/dt Random Phase Triac Drivers
Electrical Characteristics (Continued)
T
A
= 25°C unless otherwise specified.
Transfer Characteristics
Note:
4. All devices are guaranteed to trigger at an I
F
value less than or equal to max I
FT
.Therefore, recommended operating
I
F
lies between max I
FT
(2 mA for FOD420 and FOD4208 and 1.3 mA for FOD4216 and FOD4218) and the absolute
max I
F
(30 mA).
Isolation Characteristics
Note:
5. Isolation voltage, V
ISO
, is an internal device dielectric breakdown rating. For this test, pins 1, 2 and 3 are common,
and pins 4, 5 and 6 are common. 5,000 VAC
RMS
for 1 minute duration is equivalent to 6,000 VAC
RMS
for 1 second
duration.
Symbol Parameter Test Conditions Device Min. Typ. Max. Unit
I
FT
LED Trigger Current Main Terminal Voltage = 5 V
(4)
FOD420,
FOD4208
0.75 2.0
mA
FOD4216,
FOD4218
0.75 1.3
V
TM
Peak On-State Voltage,
Either Direction
I
TM
= 300 mA peak, I
F
= Rated I
FT
All 2.2 3 V
I
H
Holding Current, Either
Direction
V
T
= 3 V All 200 500 µA
I
L
Latching Current V
T
= 2.2 V All 5 mA
t
ON
Turn-On Time
PF = 1.0,
I
T
= 300 mA
V
RM
= V
DM
= 424 VAC
FOD420,
FOD4216,
FOD4218
60 µs
V
RM
= V
DM
= 565 VAC FOD4208
t
OFF
Turn-Off Time
V
RM
= V
DM
= 424 VAC
FOD420,
FOD4216,
FOD4218
52 µs
V
RM
= V
DM
= 565 VAC FOD4208
dv/dt
C
Critical Rate of Rise of
Voltage at Current Com-
mutation
V
D
= 230 V
RMS
,
I
D
= 300 mA
PK
All
10
V/µs
di/dt
C
Critical Rate of Rise of
On-State Current Commu-
tation
V
D
= 230 V
RMS
,
I
D
= 300 mA
PK
All 9 A/ms
dv(
IO
)/dt
Critical Rate of
Rise of Coupled
Input/Output Voltage
I
T
= 0 A, V
RM =
V
DM
= 424 VAC All 10,000 V/µs
Symbol Parameter Test Conditions Device Min. Typ. Max. Unit
V
ISO
Steady State Isolation
Voltage
f = 60 Hz, t = 1 Minute
(5)
All 5,000 VAC
RMS