Data Sheet

©2003 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD3120 Rev. 1.4 6
FOD3120 — High Noise Immunity, 2.5 A Output Current, Gate Drive Optocoupler
Switching Characteristics
Apply over all recommended conditions, typical value is measured at V
DD
= 30 V, V
SS
= Ground, T
A
= 25°C
unless otherwise specified.
Notes:
11. The difference between t
PHL
and t
PLH
between any two FOD3120 parts under same test conditions.
12. Common mode transient immunity at output high is the maximum tolerable negative dVcm/dt on the trailing edge of
the common mode impulse signal, Vcm, to assure that the output will remain high (i.e. V
O
> 15.0 V).
13. Common mode transient immunity at output low is the maximum tolerable positive dVcm/dt on the leading edge of
the common pulse signal, Vcm, to assure that the output will remain low (i.e. V
O
< 1.0 V).
Symbol Parameter Conditions Min. Typ. Max. Unit
t
PHL
Propagation Delay Time to Logic
Low Output
I
F
= 7 mA to 16 mA,
Rg = 10 Ω , Cg =10 nF,
f = 10 kHz, Duty Cycle = 50%
150 275 400 ns
t
PLH
Propagation Delay Time to Logic
High Output
150 255 400 ns
PWD
Pulse Width Distortion,
| t
PHL
– t
PLH
|
20 100 ns
PDD
(Skew)
Propagation Delay Difference
Between Any Two Parts or
Channels, (t
PHL
– t
PLH
)
(11)
-250 250 ns
t
R
Output Rise Time (10% – 90%) 60 ns
t
F
Output Fall Time (90% – 10%) 60 ns
t
UVLO ON
UVLO Turn On Delay I
F
= 10 mA, V
O
> 5 V 1.6 μs
t
UVLO OFF
UVLO Turn Off Delay I
F
= 10 mA, V
O
< 5 V 0.4 μs
| CM
H
|
Common Mode Transient
Immunity at Output High
T
A
= 25°C, V
DD
= 30 V,
I
F
= 7 to 16 mA,
V
CM
= 2000 V
(12)
35 50 kV/μs
| CM
L
|
Common Mode Transient
Immunity at Output Low
T
A
= 25°C, V
DD
= 30 V, V
F
= 0 V,
V
CM
= 2000 V
(13)
35 50 kV/μs