Data Sheet

©2003 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD3120 Rev. 1.4 15
FOD3120 — High Noise Immunity, 2.5 A Output Current, Gate Drive Optocoupler
Test Circuit (Continued)
Figure 31. t
PHL
, t
PLH
, t
R
and t
F
Test Circuit and Waveforms
Figure 32. CMR Test Circuit and Waveforms
V
O
Probe
F = 10 kHz
DC = 50%
I
F
V
OUT
t
PLH
Cg = 10 nF
Rg = 10 Ω
50 Ω
1
2
3
4
8
7
6
5
0.1 μF
+ V
DD
= 15 to 30 V
–
+
–
t
r
t
f
90%
50%
10%
t
PHL
1
2
A
B
V
O
3
4
8
7
6
5
0.1 μF
V
DD
= 30 V
V
CM
= 2,000 V
I
F
+
–
5V
+
–
Δt
V
CM
V
O
Switch at A: I
F
= 10 mA
Switch at B: I
F
= 0 mA
V
OH
V
O
V
OL
0V
+ –