Data Sheet

©2003 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD3120 Rev. 1.4 14
FOD3120 — High Noise Immunity, 2.5 A Output Current, Gate Drive Optocoupler
Test Circuit (Continued)
Figure 28. I
FLH
Test Circuit
Figure 29. V
FHL
Test Circuit
Figure 30. UVLO Test Circuit
1
2
V
O
> 5 V
3
4
8
7
6
5
0.1 μF
IF
+ V
DD
= 15 to 30 V
–
1
2
V
F
= –0.3 to 0.8 V
V
O
3
4
8
7
6
5
0.1 μF
+
–
1
2
V
O
= 5 V
3
4
8
7
6
5
0.1 μF
15 V or 30 V
V
DD
Ramp
+
–
I
F
= 10 mA
+ V
DD
= 15 to 30 V
–