Data Sheet

©2003 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD3120 Rev. 1.4 13
FOD3120 — High Noise Immunity, 2.5 A Output Current, Gate Drive Optocoupler
Test Circuit (Continued)
Figure 26. I
DDH
Test Circuit
Figure 27. I
DDL
Test Circuit
1
2
I
F
= 7 to 16 mA
V
O
3
4
8
7
6
5
0.1 μF
+ V
DD
= 30 V
–
1
2
V
F
= -0.3 to 0.8 V
V
O
3
4
8
7
6
5
0.1 μF
+ V
DD
= 30 V
–
+
–