Data Sheet

©2003 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD3120 Rev. 1.4 11
FOD3120 — High Noise Immunity, 2.5 A Output Current, Gate Drive Optocoupler
Test Circuit
Figure 22. I
OL
Test Circuit
Figure 23. I
OH
Test Circuit
+
+
Power Supply
V
DD
= 15 V to 30 V
Power Supply
V = 6 V
1
2
PW = 4.99 ms
Period = 5 ms
R
OUT
= 50 Ω
R2
100 Ω
Frequency = 200 Hz
Duty Cycle = 99.8%
V
DD
= 15 V to 30 V
V
SS
= 0 V
V
F(OFF)
= -3.0 V to 0.8 V
C1
0.1 μF
Pulse-In
LED-IFmon
Pulse Generator
Test Conditions:
3
4
8
7
6
5
To Scope
V
OL
R1
100 Ω
47 μF
C2
+
C3
0.1 μF
D1
47 μF
C4
+
Iol
1
2
PW = 10 μs
Period = 5 ms
R
OUT
= 50 Ω
R2
100 Ω
Frequency = 200 Hz
Duty Cycle = 0.2%
V
DD
= 15 V to 30 V
V
SS
= 0 V
I
F
= 7 mA to 16 mA
C1
0.1 μF
Pulse-In
LED-IFmon
Pulse Generator
Test Conditions:
3
4
8
7
6
5
Power Supply
V
DD
= 15 V to 30 V
+
+
–
Power Supply
V = 6 V
To Scope
V
OH
R1
100 Ω
47 μF
C2
+
C3
0.1 μF
D1
Current
Probe
Ioh
47 μF
C4
+