Data Sheet
© 2012 Fairchild Semiconductor Corporation www.fairchildsemi.com
FAN3180 • Rev. 1.0.3 13
FAN3180 — Single 2-A Low-Side Driver with 3.3-V LDO
Layout and Connection Guidelines
The FAN3180 incorporates fast reacting input circuits,
short propagation delays, and output stages capable of
delivering current peaks over 1 A to facilitate voltage
transition times from under 10 ns to over 100 ns. The
following guidelines are strongly recommended:
Keep high-current output and power ground paths
separate from logic input signals and signal ground
paths. This is especially critical when dealing with
TTL-level logic thresholds.
Keep the driver as close to the load as possible to
minimize the length of high-current traces. This
reduces the series inductance to improve high-
speed switching, while reducing the loop area that
can radiate EMI to the driver inputs and other
surrounding circuitry.
Many high-speed power circuits can be susceptible
to noise injected from their own output or other
external sources, possibly causing output re-
triggering. These effects can be especially obvious
if the circuit is tested in breadboard or non-optimal
circuit layouts with long input, enable, or output
leads. For best results, make connections to all pins
as short and direct as possible.
The turn-on and turn-off current paths should be
minimized as discussed in the following sections.
Figure 33 shows the pulsed gate-drive current path
when the gate driver is supplying gate charge to turn the
MOSFET on. The current is supplied from the local
bypass capacitor, C
BYP
, and flows through the driver to
the MOSFET gate and to ground. To reach the high
peak currents possible, the resistance and inductance in
the path should be minimized. The localized C
BYP
acts
to contain the high peak-current pulses within this
driver-MOSFET circuit, preventing them from disturbing
the sensitive analog circuitry in the PWM controller.
PWM
V
DS
V
DD
C
BYP
FAN3180
Figure 33. Current Path for MOSFET Turn-On
Figure 34 shows the current path when the gate driver
turns the MOSFET off. Ideally, the driver shunts the
current directly to the source of the MOSFET in a small
circuit loop. For fast turn-off times, the resistance and
inductance in this path should be minimized.
PWM
V
DS
V
DD
C
BYP
FAN3180
Figure 34. Current Path for MOSFET Turn-Off
Thermal Guidelines
Gate drivers used to switch MOSFETs and IGBTs at
high frequencies can dissipate significant amounts of
power. It is important to determine the driver power
dissipation and the resulting junction temperature in the
application to ensure that the part is operating within
acceptable temperature limits.
The total power dissipation in a gate driver is the sum of
three components; P
GATE
, P
QUIESCENT
, and P
DYNAMIC
:
Dynamicgatetotal
P P P
(1)
Gate Driving Loss: The most significant power loss
results from supplying gate current (charge per unit
time) to switch the load MOSFET on and off at the
switching frequency. The power dissipation that results
from driving a MOSFET at a specified gate-source
voltage, V
GS
, with gate charge, Q
G
, at switching
frequency, f
SW
, is determined by:
swGSGGATE
f V Q P
(2)
Dynamic Pre-drive / Shoot-through Current: A power loss
resulting from internal current consumption under
dynamic operating conditions, including pin pull-up /
pull-down resistors, can be obtained using the I
DD
(No-
Load) vs. Frequency graphs in Typical Performance
Characteristics to determine the current I
DYNAMIC
drawn
from V
DD
under actual operating conditions:
DDDYNAMICDYNAMIC
V I P
(3)
Once the power dissipated in the driver is determined,
the driver junction temperature rise with respect to the
device lead can be evaluated using thermal equation:
CJLTOTALJ
T P T
(4)
where:
T
J
= driver junction temperature;
θ
JL
= thermal resistance from junction to lead; and
T
L
= lead temperature of device in application.