Datasheet

Common Precautions for All MOS FET Relays
56
DIP
SOP
SSOP
USOP
VSON
S-VSON
General-purpose
Introduction
High-load-voltage Multi-contact-pair
(2a, 2b, and 1a1b)
High-current and
Low-ON-resistance
Small and High-
dielectric-strength
High-dielectric-
strength
Current-limiting
Low-output-capacitance
and Low-ON-resistance
Small and High-
load-voltage
Certified Models with
Standards Certification
Common Precautions for All MOS FET Relays
Data on Estimated Temporal Changes in GaAs LEDs Estimated Life Data for GaAs LEDs
The above estimated life data is reference data that was based
on LED long-term appraisal for a single lot.
Operating conditions that exceed the ratings for some models
are included, but this in no way implies any warranty for
operation that exceeds the ratings.
F50% Life:
For the life to a 50% cumulative failure rate, this is the time that is
required for the AVG average line in the data on estimated
temporal changes to reach the failure criteria.
F0.1% Life:
For the life to a 0.1% cumulative failure rate, this is the time that
is required for the AVG-3α line in the data on estimated temporal
changes to reach the failure criteria.
Whether to use estimated F50% life or F0.1% life should be
determined based on the reliability required in the actual
equipment, however, estimated F0.1% life is normally
recommended.
"Optical output deterioration Δpo" is the amount of LED optical
output deterioration compared to the initial LED output. When
"Optical output deterioration failure criterion Δpo < - 50%", a
failure is detected when optical output has deteriorated 50%
from the initial output.
Whether to use optical output deterioration Δpo < - 50% or Δpo
< - 30% should be determined based on the amount of leeway to
be provided in the LED forward current (I
F) setting with respect to
the trigger LED forward current (I
FT). However, the Δpo < - 30%
graph is normally recommended.
Test conditions:
IF = 50 mA, Ta = 40°C
0
20
40
60
80
100
120
140
1 10 100 1000 10000 100000
Test time (h)
Relative rate of change in light output Po (%)
Rate of change average (%)
Rate of change average – 3σ (%)
Test conditions:
IF = 20 mA, Ta = 40°C
0
20
40
60
80
100
120
140
Test time (h)
Relative rate of change in light output Po (%)
1 10 100 1000 10000 100000
Rate of change average (%)
Rate of change average – 3σ (%)
Test conditions:
IF = 10 mA, Ta = 40°C
0
20
40
60
80
100
120
140
Test time (h)
Relative rate of change in light output Po (%)
1 10 100 1000 10000 100000
Rate of change average (%)
Rate of change average – 3σ (%)
Failure criteria: Light output deterioration ΔPo < −50%
100
1000
10000
100000
1000000
10000000
5432
Ambient temperature (°C)
Estimated life (h)
IF=10mA
IF=20mA
IF=30mA
IF=40mA
IF=50mA
IF=10mA
IF=20mA
IF=30mA
IF=40mA
IF=50mA
Estimated F50% life
Estimated F0.1% life
227 150 100 8560 25 0
-30 -50 -73
1/K(x10
-3
)
Failure criteria: Light output deterioration ΔPo < −30%
100
1000
10000
100000
1000000
10000000
5432
Ambient temperature (°C)
Estimated life (h)
IF=10mA
IF=20mA
IF=30mA
IF=40mA
IF=50mA
IF=10mA
IF=20mA
IF=30mA
IF=40mA
IF=50mA
227 150 100 8560 25 0
-30 -50 -73
1/K(x10
-3
)
Estimated F50% life
Estimated F0.1% life