User Manual

38
Section 2 Tags
RFID System
User's Manual
Section 2
Specifications and Performance
• Tag Heat Resistivity
• Storing Tags under high temperatures will adversely affect the performance of the internal parts and
the service life of the Tags.
• An LTPD of 10% was determined during the evaluation for Tags that reached the end of their life after
testing under the following test conditions
• Heat cycle: Room temperature/200ÅãC, 30 minutes each for 2,000 cycles.
• Normal operation has been confirmed after performing the above tests, although minor cracks may
occur.
LTPD: Lot tolerance percent defective
The lower limit of the malfunction rate for lots to be considered unacceptable during reliability testing.
• Reference Data (Evaluation Test Results)
Room temp. / 180
0 500 1000 1500 2000 2500 3000 3500 4000
10%
9%
8%
7%
6%
5%
4%
3%
2%
1%
0%
Number of cycles
Defective rate(%)
Heat Resistance Evaluation Results
Defective Operation
, 30min each
Room temp. / 200 , 30min each
Room temp. / 220 , 30min each